24 | Keysight | Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Data Sheet
Software Applications
86100D-200 enhanced jitter analysis
86100D-SIM InfiniiSim-DCA
Option 200 provides extensive and accurate jitter decomposition,
At higher data rates, the effect of measurement fixtures and
which is increasingly important as data rates increase and margins channels is prominent and can be accounted for through the
reduce. Quickly customize your view of many parameters and take de-embedding capabilities within Option SIM. You may also view
advantage of advanced features such as jitter spectrum analysis.
measurements on live and simulated signals, allowing you to
compare design intent to actual performance.
86100D-201 advanced waveform analysis
N1012A OIF CEI compliance and debug application
Take advantage of powerful features in Option 201 to generate
much deeper waveform files, integrate MATLAB analysis, and use
equalizers (CTLE, LFE, DFE), User Operators and User Defined
Measurements.
The N1012A application lets you fully characterize the ~120 trans-
mitter test parameters (including 28G-VSR), reducing your test time
from hours to minutes. Included are return loss tests and several
utilities to improve your test productivity. Debug mode enables you
to characterize your devices well beyond the parameters prescribed
in the implementation agreements.
86100D-202enhancedimpedanceandS-parameter
Option 202 works in TDR mode and provides live S-parameter
responses, including magnitude (return loss, insertion loss, etc.),
phase and group delay. Single-ended, differential and mixed-
mode responses are available simultaneously. Also enables quick
and easy saving of measurement results in Touchstone files (.s2p,
.s4p, etc.).
N1014A SFF-8431 compliance and debug
application
The N1014A application lets you fully characterize ~70 test
parameters including all transmitter tests for host, module and host
copper and all test signals for receiver testing. Return loss tests and
utilities are also included.
86100D-300 amplitude analysis/RIN/Q-factor
Extend the many capabilities from jitter mode into the amplitude
domain and see the decomposition of the amplitude into several
factors. Option 300 also reports relative intensity noise (RIN) and
Q-factor.
N1019A user-defined application
You may create your own test application or suite of tests using the
DCA-X and other instruments. Quickly and intuitively create groups
of tests, test descriptions, user prompts and test limits. Use concise
HTML reports to share your multiple test results with your users.
86100D-400 PLL and jitter spectrum
Option 400 quickly characterizes key parameters of phase-locked
loops and provides the jitter spectrum of your signal including
spread spectrum clocks. Control of the jitter source and receiver
is integrated to ensure fast results.
N1081-4A IEEE802.3 Ethernet applications
The extensive requirements for IEEE802.3-2012, 802.3bj and
802.3bm are covered in these four applications, which comprise
> 400 tests. Characterize your device for one, four or ten lanes, and
analyze trends over time/temperature and between devices.
86100D-401 advanced EYE analysis
For device testing with long patterns and to obtain BER-contour
mask testing, Option 401 integrates with the classic or FlexDCA
interfaces to decompose the jitter and amplitude interference
measurements into the key parameters. When using the
embedded capability within FlexDCA or the included automation
application, you may characterize jitter on simultaneous multiple
lanes and obtain concise and visual results.
N1085A PAM4 Ethernet and OIF-CEI
Measurement Application
The N1085A software application covers PAM-4 transmitter
measurements outlined in IEEE P802.3bs and four OIF-CEI-4.0
(56G) clauses.
86100D-9FP PAM-N analysis software
Accurately and quickly analyze Pulse Amplitude Modulation
(PAM) signals as described in IEEE 802.3bj Clause 94 and
developing standards such as OIF-CEI-56G and IEEE 400G.
86100D-BFP Automatic Fixture Removal (AFR)
When measuring physical layer devices with non-coaxial interfaces,
test fixtures or probes are often used to connect the device under
test (DUT) to the measurement equipment. For accurate measure-
ments of the DUT, the fixtures or probes need to be characterized
and their effects removed from the composite measurement of
the DUT plus test fixture or probe combination. This option adds
the Automatic Fixture Removal (AFR) capability from Keysight’s
powerful N1930B Physical Layer Test System (PLTS) software to
help you characterize a fixture or probe with non-coaxial interfaces.
Fixtures and probes to be characterized can be single-ended or
differential.
86100D-TFP IEEE TDECQ Analysis software
A lower cost subset of option 9FP capabilities that targets optical
Transmitter production test applications
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