Compliant BER-contour Based
Mask Testing
Calibrate Stressed
Eye Transmitters
86100 Software:
– 86100CU-401 Advanced EYE
Analysis or 86100DU-401
Advanced EYE Analysis
– 86100C/D-200 Enhanced
Jitter Analysis (required for DDPWS,
optional for all
Sampling scopes, due to their unmatched
signal fidelity, continue to be the de facto
standard for mask testing. However,
some specifications like CEI 2.0 and XFP
MSA, specify an eye mask test based on a
specified BER such as 1E-12. While these
masks can be modified and run using
traditional scope-based mask testing,
it’s now possible to perform BER-contour
based mask testing using Option 401.
The dual-Dirac model is commonly used
in technology standards to quickly and
accurately estimate total jitter defined at
a low BER such as TJ @ 1E-12. However,
calibrating a stressed eye transmitter with
large amounts of jitter can often be a
challenge for test equipment using
other measurements)
Note - For ultra-low level jitter measurements
(RJ<500fs) we recommend using Option-401
in conjunction with 86100C/D-200.
this standards-based estimation
technique. In the presence of increasing
RJ injection, for example, reported DJ will
tend to decrease and seem to “disappear”
on BERTs and scopes using this model.
J2 jitter, sometimes referred to as “99%
Jitter” or “all but 1% for jitter”, is some-
times used by engineers when calibrating
stressed-eye signals for receiver testing.
Why? J2 “measures” jitter directly from
histogram data rather than “estimating”
jitter based on models. IEEE 802.3ae
(2002) and draft specifications such as
IEEE 802.3ba and SFF-8431 are examples
of standards that use this high probability
jitter measurement. J9 Jitter is “all but
10E-9” of the jitter distribution and is
estimated at a BER of 2.5E-10.
PC Software:
86100CU-401 and 86100DU-
401 Measurements
– Microsoft Office Excel2003 or
Excel 2007
– Keysight Technologies, Inc. IO
Libraries Suite Rev 15.0 (or later)
The application performs the following
measurements:
Optional Hardware:
Jitter Measurements
– External PC
Total Jitter (TJ), Random Jitter (RJ),
Deterministic Jitter (DJ), J2 Jitter (J2), J9
Jitter (J9), Data Dependent Pulse Width
Shrinkage (DDPWS)*
– 82357B USB/GPIB Interface USB 2.0
Instrument control is made using either
LAN or GPIB.
* Requires 86100C/D-200
For more information visit:
www.keysight.com/find/eye
www.keysight.com/find/emailupdates
www.keysight.com/find/dcax
Amplitude Measurements
Total Interference (TI), Random Noise (RN),
Deterministic Interference (DI),
Eye Opening.
86100CU-401 and 86100DU-401 are ca-
pable of measuring jitter in excess of 0.7UI
so they are an ideal solution for calibrating
stressed eye transmitters. It also reports
J2 and J9, thereby saving engineers from
having to measure histogram data and
calculate these parameters offline.
Mask Test
Pass/Fail Status, BER limit.Standards
based BER contour masks, such as
OIF-CEI-2.0 and XFP, included. User-
defined masks also supported.
Typical System Configurations
Advanced EYE Analysis software
Figure 4 – A typical hardware configuration
includes 86100C C/D DCA Wideband
oscilloscope and an 86108A Precision
Waveform Analyzer.
application operates with any 86100C/D
hardware configuration. It performs com-
pliant jitter and mask measurements on
optical or electrical signals. Option-401
is ordered as a software upgrade and is
licensed to a single 86100C/D mainframe
using the instruments’s host ID and
serial number.
For more information on Keysight Technologies’
products, applications or services, please
contact your local Keysight office.
Figure 3 −Precision mask testing using BER
contours. Image shows 1E-12 contour (red
line) compared to OIF-CEI 2.0 mask.
86100 Hardware:
The complete list is available at:
– 86100C or 86100D Mainframe
– 86100C-001 Enhanced Trigger or
86100D-ETR Enhanced Trigger
(required for DDPWS, otherwise
optional)
www.keysight.com/find/contactus
This information is subject to change without notice.
© Keysight Technologies, 2009 – 2014
Published in USA, July 31, 2014
5990-3818EN
– Any DCA measurement module
www.keysight.com