ALUMINUM ORGANIC CAPACITORS
Performance Characteristics
ENVIRONMENTAL
11. Temperature Stability
Mounted capacitors withstand extreme temperature
testing at a succession or continuous steps at
+25°C, -55°C, +25°C, +85°C, +125°C, +25°C in that
order. Capacitors are allowed to stabilize at each
temperature before measurement. Cap, DF, and
DCL are measured at each temperature; except DC
Leakage is not measured at -55°C.
Step
1
2
3
4
5
6
16. Moisture Sensitivity Level (MSL)
• J-Std-020
a. Capacitance: within ±30% of initial value
b. DF: within initial limit
c. DC Leakage: within initial limit
d. ESR: within 2 x initial limit
Meets MSL 3 requirements for SnPb assembly.
17. Load Humidity
• 85°C, 85% RH, Rated Voltage, 500 Hours
a. Capacitance: within +30/-5% of initial value
b. DF: within initial limit
c. DC Leakage: within 5 x initial limit
d. ESR: within 2 x initial limit
18. ESD
• Polymer Aluminum capacitors are not sensi-
tive to Electro-Static Discharge (ESD).
19. Failure Mechanism and Reliability
The normal failure mechanism is dielectric break
down. Dielectric failure can result in high DC
Leakage current and may proceed to the level of a
short circuit. With sufficient time to charge, healing
may occur by one of two potential mechanisms. The
polymer adjacent to the dielectric fault site may over-
heat and vaporize, disconnecting the fault site from
the circuit. The polymer may also oxidize into a more
resistive material that caps the defect site in the
dielectric and reduces the flow of current.
Capacitor failure may be induced by exceeding the
rated conditions of forward DC voltage, reverse DC
voltage, surge current, power dissipation or tempera-
ture. Excessive environmental stress, such as pro-
longed or high temperature reflow processes may
also trigger dielectric failure.
20. Resistance to Solvents
• Mil-Std 202, Method 215
Post Test Performance:
a. Capacitance: within ±10% of initial value
b. DF: within initial limit
c. DC Leakage: within initial limit
d. ESR: within initial limit
e. Physical: no degradation of case, terminals or
marking
21. Fungus
• Mil-Std-810, Method 508
22. Flammability
• UL94 VO Classification
Temp
25°C
-55°C
+25°C
+85°C
+125°C
+25°C
∆
Cap
Specified
Tolerance
15% of
initial value
5% of
initial value
15% of
initial value
20% of
initial value
5% of
initial value
DCL
Catalog
Limit
N/A
Catalog
Limit
2X Catalog
Limit
2X Catalog
Limit
Catalog
Limit
DF
Catalog
Limit
Catalog
Limit
Catalog
Limit
Catalog
Limit
Catalog
Limit
Catalog
Limit
Table 4 - Acceptable limits are as follows:
12. Standard Life Test
• 85°C, Rated Voltage, 2000 Hours
Post Test Performance:
a. Capacitance: within ±10% of initial value
b. DF: within initial limit
c. DC Leakage: within initial limit
d. ESR: within initial limit
13. High Temperature Life Test
• 125°C, Rated Voltage, 2000 Hours
Post Test Performance:
a. Capacitance: within ±10% of initial value
b. DF: within initial limit
c. DC Leakage: within 1.25 x initial limit
d. ESR: within 2 x initial limit
14. Storage Life Test
• 125°C, O VDC, 2000 Hours
Post Test Performance:
a. Capacitance: within ±10% of initial value
b. DF: within initial limit
c. DC Leakage: within 1.25 x initial limit
d. ESR: within 2 x initial limit
15. Thermal Shock
• Mil-Std-202, Method 107, Condition B
Minimum temperature is -55°C
Maximum temperature is +125°C
Post Test Performance:
a. Capacitance: within ±10% of initial value
b. DF: within initial limit
c. DC Leakage: within initial limit
d. ESR: within 2 x initial limit
©KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300
61
Aluminum Organic Capacitors
KEMET [ KEMET CORPORATION ]
