DSCC Approved 03028 (BR/BX Dielectrics)
Electrical Parameters/Characteristics: BR Dielectric
Operating Temperature Range
Capacitance Change with Reference to +25°C and 0 Vdc Applied:
Capacitance Change with Reference to +25°C and 100% Rated Vdc Applied:
Aging Rate (Max % Cap Loss/Decade Hour)
Dielectric Withstanding Voltage
Dissipation Factor (DF%) Maximum Limits @ 25ºC
Insulation Resistance (IR) Limit @ 25°C
Insulation Resistance (IR) Limit @ 125°C
-55°C to +125°C
±15%
+15%, -40%
1%
250%
5% (10V), 3.5% (16V & 25V) and 2.5% (50V to 200V)
1000 megohm microfarads (minimum) or 100GΩ
100 megohm microfarads (minimum) or 10GΩ
To obtain the IR limit, divide M
Ω-μF
value by the capacitance and compare to GΩ limit. Select the lower of the two limits.
Capacitance and Dissipation Factor (DF) measured under the following conditions:
1kHz ± 50Hz and 1.0 ± 0.2 Vrms if capacitance >1000pF
Electrical Parameters/Characteristics: BX Dielectric
Operating Temperature Range
Capacitance Change with Reference to +25°C and 0 Vdc Applied:
Capacitance Change with Reference to +25°C and 100% Rated Vdc Applied:
Aging Rate (Max % Cap Loss/Decade Hour)
Dielectric Withstanding Voltage
Dissipation Factor (DF%) Maximum Limits @ 25ºC
Insulation Resistance (IR) Limit @ 25°C
Insulation Resistance (IR) Limit @ 125°C
-55°C to +125°C
±15%
+15%, -25%
1%
250%
5% (10V), 3.5% (16V & 25V) and 2.5% (50V to 200V)
1000 megohm microfarads (minimum) or 100GΩ
100 megohm microfarads (minimum) or 10GΩ
To obtain the IR limit, divide M
Ω-μF
value by the capacitance and compare to GΩ limit. Select the lower of the two limits.
Capacitance and Dissipation Factor (DF) measured under the following conditions:
1kHz ± 50Hz and 1.0 ± 0.2 Vrms if capacitance >1000pF
Qualification/Certification
Qualification Inspection per MIL-PRF-55681
Inspection
Group I
Voltage conditioning
DWV
IR (elevated temperature)
Capacitance
Dissipation factor
IR
DWV
Visual and mechanical examination
Group II
Solderability
Group III
Voltage-temperature limits
Thermal shock and immersion
Group IV
Resistance to soldering heat
Moisture resistance
Group V
Life (at elevated ambient temperature)
Group VIII
Humidity, steady state, low voltage
Test method paragraph
4.8.3
4.8.9
4.8.6
4.8.4
4.8.5
4.8.6
4.8.9
4.8.2
4.8.10
4.8.11
4.8.12
4.8.13
4.8.14
4.8.16
4.8.15
F4005 06/10
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com
KEMET [ KEMET CORPORATION ]
