JST134 Series
JieJie Microelectronics CO. , Ltd
FIG.5: Non-repetitive surge peak on-state current
FIG.6: Relative variations of gate trigger current
for a sinusoidal pulse with width tp<20ms and
versus junction temperature
2
corresponding value of I t (Ⅰ-Ⅱ-Ⅲ:dI/dt < 50A/μs;
Ⅳ:dI/dt < 10A/μs)
ITSM (A), I2t (A2s)
300
IGT(Tj)/IGT(Tj=25℃)
3.0
ITSM
2.5
100
IGT4
2.0
dI/dt(Ⅰ-Ⅱ-Ⅲ)
1.5
dI/dt(Ⅳ)
IGT1&IGT2
10
1.0
0.5
2
I t
IGT3
Tj(℃)
tp(ms)
1
0.01
0.0
-40 -20
0.1
1
10 20
0
20
40
60
80
100 120 140
FIG.7: Relative variations of holding current
versus junction temperature
IH(Tj)/IH(Tj=25℃)
FIG.8: Relative variations of latching current
versus junction temperature
IL(Tj)/IL(Tj=25℃)
3.0
3.0
2.5
2.0
1.5
1.0
0.5
0.0
2.5
2.0
1.5
1.0
0.5
0.0
IL3
IL4
IH1&IH3
IL1&IL2
Tj(℃)
40 60
Tj(℃)
40 60
-40 -20
0
20
80
100 120 140
-40 -20
0
20
80
100 120 140
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