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IC61C1024-25K 参数 Datasheet PDF下载

IC61C1024-25K图片预览
型号: IC61C1024-25K
PDF下载: 下载PDF文件 查看货源
内容描述: [Standard SRAM, 128KX8, 25ns, CMOS, PDSO32, 0.400 INCH, SOJ-32]
分类和应用: 静态存储器光电二极管内存集成电路
文件页数/大小: 11 页 / 147 K
品牌: ISSI [ INTEGRATED SILICON SOLUTION, INC ]
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IC61C1024
IC61C1024L
READ CYCLE SWITCHING CHARACTERISTICS
(1)
(Over Operating Range)
Symbol
Parameter
Read Cycle Time
Address Access Time
Output Hold Time
CE1
Access Time
CE2 Access Time
OE
Access Time
-12
(2)
Min. Max.
12
3
0
0
2
2
0
0
12
12
12
6
6
7
12
-15 ns
Min. Max.
15
3
0
0
2
2
0
0
15
15
15
7
6
8
12
-20 ns
Min. Max.
20
3
0
0
3
3
0
0
20
20
20
9
7
9
18
-25 ns
Min. Max.
25
3
0
0
3
3
0
0
25
25
25
9
10
10
20
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
t
RC
t
AA
t
OHA
t
ACE
1
t
ACE
2
t
DOE
t
LZOE
(3)
OE
to Low-Z Output
t
HZOE
(3)
OE
to High-Z Output
t
LZCE
1
(3)
CE1
to Low-Z Output
t
LZCE
2
(3)
CE2 to Low-Z Output
t
HZCE
(3)
CE1
or CE2 to High-Z Output
t
PU
(4)
t
PD
(4)
CE1
or CE2 to Power-Up
CE1
or CE2 to Power-Down
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V
and output loading specified in Figure 1.
2. -12 ns device for IC61C1024 only.
3. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
4. Not 100% tested.
AC TEST CONDITIONS
Parameter
Input Pulse Level
Input Rise and Fall Times
Input and Output Timing
and Reference Level
Output Load
Unit
0V to 3.0V
3 ns
1.5V
See Figures 1 and 2
AC TEST LOADS
480
5V
480
5V
OUTPUT
30 pF
Including
jig and
scope
255
OUTPUT
5 pF
Including
jig and
scope
255
Figure 1
6
Figure 2
Integrated Circuit Solution Inc.
AHSR008-0B 10/18/2001