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41LV16100B-50K 参数 Datasheet PDF下载

41LV16100B-50K图片预览
型号: 41LV16100B-50K
PDF下载: 下载PDF文件 查看货源
内容描述: 1M ×16 ( 16兆位)动态RAM与EDO页模式 [1M x 16 (16-MBIT) DYNAMIC RAM WITH EDO PAGE MODE]
分类和应用:
文件页数/大小: 22 页 / 145 K
品牌: ISSI [ INTEGRATED SILICON SOLUTION, INC ]
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®
ISSI  
IS41LV16100B  
ABSOLUTE MAXIMUM RATINGS(1)  
Symbol  
VT  
Parameters  
Rating  
–0.5 to +4.6  
–0.5 to +4.6  
50  
Unit  
V
Voltage on Any Pin Relative to GND  
SupplyVoltage  
3.3V  
3.3V  
VDD  
IOUT  
PD  
V
OutputCurrent  
mA  
W
PowerDissipation  
1
TA  
CommercialOperationTemperature  
IndustrialOperationTemperature  
0 to +70  
-40 to +85  
°C  
°C  
TSTG  
StorageTemperature  
–55 to +125  
°C  
Note:  
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent  
damage to the device. This is a stress rating only and functional operation of the device at these  
or any other conditions above those indicated in the operational sections of this specification is not  
implied. Exposure to absolute maximum rating conditions for extended periods may affect  
reliability.  
RECOMMENDED OPERATING CONDITIONS (Voltages are referenced to GND.)  
Symbol  
VDD  
Parameter  
Min.  
3.0  
Typ.  
3.3  
Max.  
3.6  
Unit  
V
SupplyVoltage  
Input High Voltage  
Input Low Voltage  
3.3V  
3.3V  
3.3V  
VIH  
2.0  
VDD + 0.3  
0.8  
V
VIL  
–0.3  
V
TA  
CommercialAmbientTemperature  
IndustrialAmbientTemperature  
0
–40  
70  
85  
°C  
°C  
CAPACITANCE(1,2)  
Symbol  
Parameter  
Input Capacitance: A0-A9  
Max.  
Unit  
pF  
CIN1  
CIN2  
5
7
7
Input Capacitance: RAS, UCAS, LCAS, WE, OE  
pF  
CIO  
Data Input/Output Capacitance: I/O0-I/O15  
pF  
Notes:  
1. Tested initially and after any design or process changes that may affect these parameters.  
2. Test conditions: TA = 25°C, f = 1 MHz.  
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774  
Rev. B  
5
04/13/05  
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