TaNFilm
®
Chip Carrier
Resistor Network
Schematic Data
3
2
1
20
19
3
2
1
20
19
R3
R2
R1
R19
R18
R4
R2
R10
4
5
6
7
8
R7
R9
R10
R11
R12
R5
18
17
16
4
5
R3
R9
R4
R5
R1
R8
18
17
16
15
14
R6
R7
R17
6
7
8
R16
R6
R15
15
14
R13
R14
R8
9
10
11
12
13
9
10
11
12
13
7800/7900
3
2
1
20
19
3
7807/7907
2
1
20
19
R2
R3
R1
R10
R9
R10
4
5
R3
18
17
16
R8
4
R2
R9
18
17
R1
5
6
R4
6
7
R4
16
15
R5
R7
15
R5
R6
R7
7
8
8
14
14
R6
R8
9
10
11
12
13
9
10
11
12
13
7808/7908
7809/7909
Environmental Data
Test Per MIL-PRF-914
Thermal Shock and Power Conditioning
Low Temperature Operation
Short Term Overload
Resistance to Bonding Exposure
Steady State Humidity
Moisture Resistance
Shock
Vibration
Life
High Temperature Exposure
Low Temperature Storage
MIL-PRF-914 Limits (ΔR%)
M
0.7
0.5
0.5
0.25
0.5
0.5
0.25
0.25
2.0
1.0
0.5
K
0.7
0.25
0.25
0.25
0.5
0.5
0.25
0.25
0.5
0.5
0.25
H
0.5
0.1
0.1
0.25
0.5
0.4
0.25
0.25
0.5
0.2
0.1
V
0.25
0.1
0.1
0.25
0.2
0.25
0.25
0.25
0.5
0.1
0.1
TaNFilm® Test Data (ΔR%)
Max
0.1
0.05
0.05
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.05
Typical
0.02
0.02
0.02
0.02
0.03
0.03
0.03
0.03
0.03
0.03
0.01
© IRC Advanced Film Division
• 4222 South Staples Street • Corpus Christi Texas 78411 USA
Telephone: 361 992 7900 • Facsimile: 361 992 3377 • Website: www.irctt.com
CCN Series Issue April 2009 Sheet 3 of 4