Specifications CD4028BMS
TABLE 6. APPLICABLE SUBGROUPS (Continued)
MIL-STD-883
CONFORMANCE GROUP
Final Test
METHOD
GROUP A SUBGROUPS
READ AND RECORD
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Group B
Sample 5005
Sample 5005
Sample 5005
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 7, 9
Subgroup B-5
Subgroup B-6
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
Group D
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
TEST
READ AND RECORD
MIL-STD-883
METHOD
CONFORMANCE GROUPS
PRE-IRRAD
POST-IRRAD
PRE-IRRAD
POST-IRRAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4
25kHz
11
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
VDD
9V ± -0.5V
50kHz
Static Burn-In 1
Note 1
1 - 7, 9, 14, 15
8, 10 - 13
16
Static Burn-In 2
Note 1
1 - 7, 9, 14, 15
8
8
8
10 - 13, 16
16
Dynamic Burn-
In Note 1
-
1 - 7, 9, 14, 15
10, 12, 13
Irradiation
Note 2
1 - 7, 9, 14, 15
10 - 13, 16
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
7-792
INTERSIL [ Intersil ]
