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5962R9675501VXC 参数 Datasheet PDF下载

5962R9675501VXC图片预览
型号: 5962R9675501VXC
PDF下载: 下载PDF文件 查看货源
内容描述: 抗辐射高速,单片式数位类比转换器 [Radiation Hardened High Speed, Monolithic Digital-to-Analog Converter]
分类和应用: 转换器
文件页数/大小: 10 页 / 363 K
品牌: INTERSIL [ INTERSIL CORPORATION ]
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HS-565ARH
Settling Time
This is a challenging measurement, in which the result
depends on the method chosen, the precision and quality of
test equipment and the operating configuration of the DAC
(test conditions). As a result, the different techniques in use
by converter manufacturers can lead to consistently different
results. An engineer should understand the advantage and
limitations of a given test methods before using the specified
settling time as a basis for design.
The approach used for several years at Harris calls for a
strobed comparator to sense final perturbations of the DAC
output waveform. This gives the LSB a reasonable
magnitude (814mV for the HS-565ARH, which provides the
comparator with enough overdrive to establish an accurate
±0.50
LSB window about the final settled value. Also, the
required test conditions simulate the DACs environment for a
common application - use in a successive approximation A/
D converter. Considerable experience has shown this to be a
reliable and repeatable way to measure settling time.
The usual specification is based on a 10V step, produced
by simultaneously switching all bits from off-to-on (tON) or
on-to-off (tOFF). The slower of the two cases is specified,
as measured from 50% of the digital input transition to the
final entry within a window of 0.50 LSB about the settled
value. Four measurements characterize a given type of
DAC:
(a) tON, to final value +0.50 LSB
(b) tON, to final value -0.50 LSB
(c) tOFF, to final value +0.50 LSB
(d) OFF, to final value -0.50 LSB
(Cases (b) and (c) may be eliminated unless the overshoot
exceeds 0.50 LSB). For example, refer to Figures 5A and5B
for the measurement of case (d).
Procedure
As shown in Figure 5B, settling time equals tX plus the
comparator delay (tD = 15ns). To measure tX,
• Adjust the delay on generator number 2 for a tX of several
microseconds. This assures that the DAC output has
settled to its final wave.
• Switch on the LSB (+5V)
• Adjust the VLSB supply for 50% triggering at COMPARA-
TOR OUT. This is indicated by traces of equal brightness
on the oscilloscope display as shown in Figure 5B. Note
DVM reading.
• Switch to LSB to Pulse (P)
• Readjust the VLSB supply for 50% triggering as before,
and note DVM reading. One LSB equals one tenth the
difference in the DVM readings noted above.
• Adjust the VLSB supply to reduce the DVM reading by
5 LSBs (DVM reads 10X, so this sets the comparator
to sense the final settled value minus 0.50 LSB). Com-
parator output disappears.
• Reduce generator number 2 delay until comparator output
reappears, and adjust for “equal brightness”.
• Measure tX from scope as shown in Figure 5B. Settling
time equals tX + tD, i.e. tX + 15ns.
TABLE 7. OPERATING MODES AND CALIBRATION
CIRCUIT CONNECTIONS
MODE
Unipolar (See Figure 3)
OUTPUT
RANGE
0 to +10V
0 to +5V
Bipolar (See Figure 4)
±10V
±5V
±2.5V
PIN 10
TO
VO
VO
NC
VO
VO
PIN 11
TO
Pin 10
Pin 9
VO
Pin 10
Pin 9
RESISTOR
(R)
1.43K
1.1K
1.69K
1.43K
1.1K
APPLY
INPUT CODE
All 0’s
All 1’s
All 0’s
All 1’s
All 0’s
All 1’s
All 0’s
All 1’s
All 0’s
All 1’s
CALIBRATION
ADJUST
R1
R2
R1
R2
R3
R4
R3
R4
R3
R4
TO SET VO
0V
+9.99756V
0V
+4.99878V
-10V
+9.99512V
-5V
+4.99756V
-2.5V
+2.49878V
Spec Number
8
518795