HS-0546RH, HS-0547RH
Burn-In/Life Test Circuits
V1
1
C1 D1
R1
2
3
4
5
6
7
8
9
10
11
12
13
F3
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
F4
F0
F1
F2
V1
D2 C2
C1 D1
R1
R2
V2
V2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
D2 C2
R2
V3
DYNAMIC AND LIFE TEST
NOTES:
1. The Dynamic Test Circuit is utilized for all life testing.
2. V1 = +15V minimum, +16V maximum.
3. V2 = -15V maximum, -16V minimum.
4. R1, R2 = 10kΩ,
±5%,
1/4 or 1/2W (per socket).
5. C1, C2 = 0.01µF minimum (per socket) or 0.1µF minimum
(per row).
6. D1, D2 = 1N4002 or equivalent (per board).
7. F0 = 100kHz, 10%; F1 = F0/2; F2 = F1/2; F3 = F2/2; F4 = F3/2
40% - 60% duty cycle; VIL = 0.8V maximum;
VIH = 4.0V minimum.
NOTES:
STATIC
8. V1 =
+5V
minimum,
+6V
maximum.
9. V2 =
+15V
minimum,
+16V
maximum.
10. V3 = -15V maximum, -16V minimum.
11. R1, R2 = 10kΩ,
±5%,
1/4 or 1/2W (per socket).
12. C1, C2 = 0.01µF minimum (per socket) or 0.1µF minimum
(per row).
13. D1, D2 = 1N4002 or equivalent (per board).
Irradiation Circuit
+15V
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
-15V
10kΩ
10kΩ
NC
+1V
+5V
5
INTERSIL [ INTERSIL CORPORATION ]
