HS-0508RH, HS-0509RH
Burn-In/Life Test Circuits
V1
F0
F3
V1
D1
C1
5
6
R1
7
8
12
D2
11
10
9
R1
C2
6
7
8
11
10
9
1
2
3
4
16
15
14
13
V2
D1
C1
5
12
D2
C2
F1
F2
V2
1
2
3
4
16
15
14
13
V3
HS-0508RH
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
V1 =
V2 =
R1 =
C1 =
D1 =
F0 =
F1 =
F2 =
F3 =
-15V maximum, -16V minimum
+15V minimum, +16V maximum
10kΩ
±5%
1/4W
C2 = 0.01µF minimum (per socket) or 0.1µF minimum (per row)
D2 = 1N4002 (or equivalent)
100kHz 50% duty cycle; VIL = 0.8V max; VIH = 4.0V min.
F0/2
F1/2
F2/2
V1 =
V2 =
V3 =
R1 =
C1 =
D1 =
HS-0508RH
STATIC BURN-IN TEST CIRCUIT
5V minimum, 6V maximum
-15V maximum, -16V minimum
+15V minimum, +16V maximum
10kΩ
±5%
1/4W
C2 = 0.01µF minimum (per socket) or 0.1µF minimum (per row)
D2 = 1N4002 (or equivalent)
F0
F2
V3
D1
C1
1
2
3
4
5
6
7
8
16
15
14
13
F1
1
2
V2
V3
D1
C1
3
4
16
15
14
13
V1
V2
D1
C1
D1
12
11
10
9
R1
C1
5
6
7
8
12
11
10
9
R1
R1
R1
HS-0509RH
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
V2 =
V3 =
R1 =
C1 =
D1 =
F0 =
+15.5V,
±.0.5V
-15.5V,
±0.5V
10kΩ,
±5%
0.1µF minimum (per socket)
1N4002 or equivalent (per board)
100kHz,
±10%;
F1 = F0/2; F2 = F1/2, 50% duty cycle,
VIL = 0.8V max.; VIH = 4.0V min.
V1 =
V2 =
V3 =
R1 =
C1 =
D1 =
HS-0509RH
STATIC BURN-IN TEST CIRCUIT
+5.5V,
±0.5V
+15.5V,
±0.5V
-15.5V,
±0.5V
10kΩ,
±10%
0.1µF minimum (per socket)
1N4002 or equivalent (per board)
4
INTERSIL [ INTERSIL CORPORATION ]
