82C86H
Absolute Maximum Ratings
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +8.0V
Input, Output or I/O Voltage . . . . . . . . . . . . GND -0.5V to V
CC
+0.5V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Thermal Information
Thermal Resistance (Typical)
θ
JA
(
o
C/W)
θ
JC
(
o
C/W)
CERDIP Package . . . . . . . . . . . . . . . .
70
16
CLCC Package . . . . . . . . . . . . . . . . . .
80
20
PDIP Package . . . . . . . . . . . . . . . . . . .
75
N/A
PLCC Package . . . . . . . . . . . . . . . . . .
75
N/A
Maximum Storage Temperature Range . . . . . . . . . -65
o
C to +150
o
C
Maximum Junction Temperature Hermetic Package . . . . . . . +175
o
C
Maximum Junction Temperature Plastic Package. . . . . . . . . +150
o
C
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . +300
o
C
(PLCC - Lead Tips Only)
Operating Conditions
Operating Voltage Range . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Range
C82C86H . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0
o
C to +70
o
C
I82C86H . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -40
o
C to +85
o
C
M82C86H . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55
o
C to +125
o
C
Die Characteristics
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 265 Gates
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
DC Electrical Specifications
V
CC
= 5.0V
±
10%; T
A
= 0
o
C to +70
o
C (C82C86H);
T
A
= -40
o
C to +85
o
C (I82C86H);
T
A
= -55
o
C to +125
o
C (M82C86H)
MIN
2.0
2.2
-
0.8
MAX
-
UNITS
V
V
V
TEST CONDITIONS
C82C86H, I82C86H
M82C86H (Note 1)
SYMBOL
V
IH
PARAMETER
Logical One
Input Voltage
V
IL
V
OH
Logical Zero Input Voltage
Logical One Output Voltage
B Outputs
A Outputs
A or B Outputs
3.0
3.0
V
CC
-0.4
V
V
V
I
OH
= -8mA
I
OH
= -4mA
I
OH
= -100µA
V
OL
Logical Zero Output Voltage
B Outputs
A Outputs
0.45
0.45
-10.0
-10.0
-
-
10.0
10.0
10
1
V
V
µA
µA
µA
mA/MHz
I
OL
= 20mA
I
OL
= 12mA
V
IN
= GND or V
CC
DIP Pins 9, 11
VO = GND or V
CC
, OE
≥
V
CC
-0.5V
DIP Pins 1 - 8, 12 - 19
V
IN
= V
CC
or GND, V
CC
= 5.5V, Outputs Open
T
A
= +25
o
C, Typical (See Note 2)
I
I
IO
ICCSB
ICCOP
NOTES:
Input Leakage Current
Output Leakage Current
Standby Power Supply
Current
Operating Power Supply
Current
1. V
IH
is measured by applying a pulse of magnitude = V
IH(MIN)
to one data input at a time and checking the corresponding device output for
a valid logical “1” during valid input high time. Control pins (T, OE) are tested separately with all device data input pins at V
CC
-0.4
2. Typical ICCOP = 1mA/MHz of read/ cycle time. (Example: 1.0µs read/write cycle time = 1mA).
Capacitance
SYMBOL
CIN
T
A
= +25
o
C
PARAMETER
Input Capacitance
B Inputs
A Inputs
18
14
pF
pF
Freq = 1MHz, all measurements are
referenced to device GND
TYPICAL
UNITS
TEST CONDITIONS
4-320
INTERSIL [ INTERSIL CORPORATION ]
