5962-0620705Q3A, 5962-0620706Q3A, 5962-0620707Q2A, 5962-0620708Q2A
Electrical Specifications
ICL3238E
Test Conditions: V
CC
= 4.5V to 5.5V, C1 = 0.01
m
F, C2 - C4 = 0.1
m
F, Unless Otherwise Specified.
Typicals are at T
A
= 25°C, V
CC
= 5.0V
(Continued) (Continued)
TEST CONDITIONS
TEMP
(°C)
MIN
TYP
MAX
UNITS
PARAMETER
ENHANCED AUTOMATIC POWER-DOWN
(FORCEON = GND, FORCEOFF = V
CC
)
Receiver Input Thresholds to
INVALID High
Receiver Input Thresholds to
INVALID Low
INVALID Output Voltage Low
INVALID Output Voltage High
TRANSMITTER OUTPUTS
Output Voltage Swing
Output Short-Circuit Current
Output Leakage Current
TIMING CHARACTERISTICS
Maximum Data Rate
Transmitter Skew
Receiver Skew
Transition Region Slew Rate
R
L
= 3kΩ, C
L
= 1000pF, One Transmitter Switching
t
PHL
- t
PLH
t
PHL
- t
PLH
V
CC
= 5.0V,
R
L
= 3kΩ to 7kΩ,
Measured From 3V to -3V or -3V
to 3V
C
L
= 150pF to 1000pF
C
L
= 150pF to 2500pF
Full
Full
Full
Full
Full
250
-
-
6
4
500
200
100
15
12
-
1000
1000
50
50
kbps
ns
ns
V/µs
V/µs
V
OUT
=
±12V,
V
CC
= 0V or 4.5V to 5.5V,
Automatic Power-down or FORCEOFF = GND
All Transmitter Outputs Loaded with 3kΩ to Ground
Full
Full
Full
±5.0
-
-
±5.4
±35
-
-
±60
±25
V
mA
µA
Powered Up
Powered Down
I
OUT
= 1.0mA
I
OUT
= -1.0mA
Full
Full
Full
Full
-2.7
-0.3
-
V
CC
-0.9
-
-
-
-
2.7
0.3
0.4
-
V
V
V
V
ESD PERFORMANCE
RS-232 Pins (T
OUT
, R
IN
)
IEC61000-4-2 Air Gap Discharge
IEC61000-4-2 Contact Discharge
Human Body Model (MIL-STD 883 Method 3015)
All Other Pins
NOTE:
4. These inputs utilize a positive feedback resistor. The input current is negligible when the input is at either supply rail.
Human Body Model (MIL-STD 883 Method 3015)
25
25
25
25
-
-
-
-
±15
±8
±15
±2.5
-
-
-
-
kV
kV
kV
kV
Die Characteristics
INTERFACE MATERIALS:
Glassivation:
Type: PSG (Phosphorous Silicon Glass)
Thickness: 13.0kÅ ± 1.0kÅ
Top Metallization:
Type: AlSiCu
Thickness: 10.0kÅ ± 1kÅ
ASSEMBLY RELATED INFORMATION:
Substrate Potential:
GND
ADDITIONAL INFORMATION:
Worst Case Current Density:
<2.0 x 10
5
A/cm
2
Transistor Count:
ICL3221E: 286
ICL3232E: 296
ICL3243E: 464
ICL3238E: 1235
Process:
Si Gate CMOS
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
7
FN6298.0
May 31, 2006
INTERSIL [ INTERSIL CORPORATION ]
