Crane Aerospace & Electronics Power Solutions
sMrt28 singlꢂ, Dꢀꢄl ꢄnd tꢃiplꢂ spꢄꢇꢂ Dc/Dc convꢂꢃꢁꢂꢃꢈ
28 VOLt Iꢆꢅut – 35 Watt – sꢅace quaLIFIeD
CL A S S H A N D K, MIL-PRF-38534 EL E M E N T EV A L U A T I O N
COmpOnent-level test
perFOrmed
spaCe prOtOtype (O)
nOn-Qml1
Class h
Qml
Class K
Qml
M/S 2
P 3
M/S 2
P 3
yes
yes
M/S 2
P 3
yes
yes
Element Electrical
Element Visual
yes
no
yes
yes
yes
yes
no
no
Internal Visual
no
no
no
no
no
no
no
N/A
no
no
no
no
no
N/A
no
yes
no
N/A
no
yes
yes
yes
yes
yes
yes
yes
N/A
N/A
yes
yes
yes
no
N/A
yes
yes
N/A
N/A
N/A
N/A
yes
yes
yes
yes
N/A
yes
Temperature Cycling
Constant Acceleration
Interim Electrical
Burn-in
no
no
no
N/A
N/A
N/A
N/A
no
no
N/A
N/A
N/A
N/A
no
no
Post Burn-in Electrical
Steady State Life
Voltage Conditioning Aging
Visual Inspection
Final Electrical
no
no
N/A
N/A
yes
yes
no
no
no
no
yes
yes
N/A
yes
Wire Bond Evaluation
SEM
no
N/A
no
SLAM™/C-SAM:
no
Input capacitors only
(Add’l test, not req. by H or K)
ꢀotes:
1. ꢀon-QML products do not meet all of the requirements of MIL-PRF-38534.
2. M/S = Active components (Microcircuit and Semiconductor Die)
3. P = Passive components
Definitions:
Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534
SEM: Scanning Electron Microscopy
SLAM™: Scanning Laser Acoustic Microscopy
C-SAM: C - Mode Scanning Acoustic Microscopy
SC r e e n I n g ta b l e 1: el e m e n t eV a l u a t I O n
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Page 17 of 19
SMRT28 Rev E - 20100216
CRANE [ Crane Aerospace & Electronics. ]
