Crane Aerospace & Electronics Power Solutions
MFL sꢀꢁglꢂ aꢁꢃ dual dc/dc cꢄꢁvꢂꢅꢆꢂꢅꢇ
28 VoLt inpꢈt – 65 Wꢉtt
ST A N D A R D A N D /ES (N O N -QML) A N D /883 (CL A S S H, QML)
PR O D U C T EL E M E N T EV A L U A T I O N
COmpOnent-level test
perFOrmed
standard and /es
nOn-Qml 1
/883
Class h Qml
M/S 2
P 3
M/S 2
P 3
Element Electrical (probe)
Element Visual
yes
no
no
no
no
no
no
yes
yes
yes
yes
yes
yes
yes
N/A
yes
yes
Internal Visual
N/A
no
Final Electrical
4
Wire Bond Evaluation
no
SLAM™/C-SAM:
Input capacitors only
(Add’l test, not req. by H)
no
no
no
yes
Notes:
1. Standard and /ES, non-QML products, do not meet all of the requirements of
MIL-PRF-38534.
2. M/S = Active components (Microcircuit and Semiconductor Die)
3. P = Passive components
4. Not applicable to EMI filters that have no wire bonds.
Definitions:
Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534
SLAM™: Scanning Laser Acoustic Microscopy
C-SAM: C - Mode Scanning Acoustic Microscopy
sc r e e n i n g ta b l e 1: el e m e n t eV a l u a t i O n
www.craneae.com/interpoint
Page 12 of 13
MFL Rev E - 20101026
CRANE [ Crane Aerospace & Electronics. ]
