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TE28F128J3C-150 参数 Datasheet PDF下载

TE28F128J3C-150图片预览
型号: TE28F128J3C-150
PDF下载: 下载PDF文件 查看货源
内容描述: 英特尔StrataFlash闪存( J3 ) [Intel StrataFlash Memory (J3)]
分类和应用: 闪存
文件页数/大小: 72 页 / 909 K
品牌: INTEL [ INTEL ]
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256-Mbit J3 (x8/x16)  
Appendix C Design Considerations  
C.1  
Three-Line Output Control  
The device will often be used in large memory arrays. Intel provides five control inputs (CE0, CE1,  
CE2, OE#, and RP#) to accommodate multiple memory connections. This control provides for:  
a. Lowest possible memory power dissipation.  
b. Complete assurance that data bus contention will not occur.  
To use these control inputs efficiently, an address decoder should enable the device (see Table 13)  
while OE# should be connected to all memory devices and the system’s READ# control line. This  
assures that only selected memory devices have active outputs while de-selected memory devices  
are in standby mode. RP# should be connected to the system POWERGOOD signal to prevent  
unintended writes during system power transitions. POWERGOOD should also toggle during  
system reset.  
C.2  
STS and Block Erase, Program, and Lock-Bit Configuration  
Polling  
STS is an open drain output that should be connected to VCCQ by a pull-up resistor to provide a  
hardware method of detecting block erase, program, and lock-bit configuration completion. It is  
recommended that a 2.5k resister be used between STS# and VCCQ. In default mode, it transitions  
low after block erase, program, or lock-bit configuration commands and returns to High Z when  
the WSM has finished executing the internal algorithm. For alternate configurations of the STS  
signal, see the Configuration command.  
STS can be connected to an interrupt input of the system CPU or controller. It is active at all times.  
STS, in default mode, is also High Z when the device is in block erase suspend (with programming  
inactive), program suspend, or in reset/power-down mode.  
C.3  
Input Signal Transitions—Reducing Overshoots and  
Undershoots When Using Buffers or Transceivers  
As faster, high-drive devices such as transceivers or buffers drive input signals to flash memory  
devices, overshoots and undershoots can sometimes cause input signals to exceed flash memory  
specifications. (See “DC Voltage Characteristics” on page 20.) Many buffer/transceiver vendors  
now carry bus-interface devices with internal output-damping resistors or reduced-drive outputs.  
Internal output-damping resistors diminish the nominal output drive currents, while still leaving  
sufficient drive capability for most applications. These internal output-damping resistors help  
reduce unnecessary overshoots and undershoots. Transceivers or buffers with balanced- or light-  
drive outputs also reduce overshoots and undershoots by diminishing output-drive currents. When  
considering a buffer/transceiver interface design to flash, devices with internal output-damping  
resistors or reduced-drive outputs should be used to minimize overshoots and undershoots. For  
additional information, please refer to AP-647, 5 Volt Intel StrataFlash® Memory Design Guide  
(Order Number: 292205).  
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Datasheet  
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