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JS28F128P30T85 参数 Datasheet PDF下载

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型号: JS28F128P30T85
PDF下载: 下载PDF文件 查看货源
内容描述: 英特尔的StrataFlash嵌入式存储器 [Intel StrataFlash Embedded Memory]
分类和应用: 闪存存储内存集成电路光电二极管
文件页数/大小: 102 页 / 1616 K
品牌: INTEL [ INTEL ]
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1-Gbit P30 Family  
Table 3.  
TSOP and Easy BGA Signal Descriptions (Sheet 2 of 2)  
Symbol  
Type  
Name and Function  
VCCQ  
VSS  
Power Output Power Supply: Output-driver source voltage.  
Power Ground: Connect to system ground. Do not float any VSS connection.  
Reserved for Future Use: Reserved by Intel for future device functionality and enhancement. These  
should be treated in the same way as a Do Not Use (DU) signal.  
RFU  
DU  
NC  
Do Not Use: Do not connect to any other signal, or power supply; must be left floating.  
No Connect: No internal connection; can be driven or floated.  
Table 4.  
QUAD+ SCSP Signal Descriptions (Sheet 1 of 2)  
Symbol  
Type  
Name and Function  
ADDRESS INPUTS: Device address inputs. 64-Mbit: A[21:0]; 128-Mbit: A[22:0]; 256-Mbit: A[23:0];  
512-Mbit: A[24:0].  
A[MAX:0]  
DQ[15:0]  
Input  
See Table 6 on page 22, Figure 11 on page 23, and Figure 12 on page 23 for 512-Mbit and 1-Gbit  
addressing.  
DATA INPUT/OUTPUTS: Inputs data and commands during write cycles; outputs data during  
memory, Status Register, Protection Register, and Read Configuration Register reads. Data balls  
float when the CE# or OE# are deasserted. Data is internally latched during writes.  
Input/  
Output  
ADDRESS VALID: Active low input. During synchronous read operations, addresses are latched on  
the rising edge of ADV#, or on the next valid CLK edge with ADV# low, whichever occurs first.  
ADV#  
Input  
In asynchronous mode, the address is latched when ADV# going high or continuously flows through  
if ADV# is held low.  
WARNING: Designs not using ADV# must tie it to VSS to allow addresses to flow through.  
FLASH CHIP ENABLE: Active low input. CE# low selects the associated flash memory die. When  
asserted, flash internal control logic, input buffers, decoders, and sense amplifiers are active. When  
deasserted, the associated flash die is deselected, power is reduced to standby levels, data and  
WAIT outputs are placed in high-Z state.  
F1-CE#  
F2-CE#  
Input  
Input  
See Table 6 on page 22 for CE# assignment definitions.  
WARNING: All chip enables must be high when device is not in use.  
CLOCK: Synchronizes the device with the system’s bus frequency in synchronous-read mode.  
During synchronous read operations, addresses are latched on the rising edge of ADV#, or on the  
next valid CLK edge with ADV# low, whichever occurs first.  
CLK  
WARNING: Designs not using CLK for synchronous read mode must tie it to VCCQ or VSS.  
OUTPUT ENABLE: Active low input. OE# low enables the device’s output data buffers during read  
cycles. OE# high places the data outputs and WAIT in High-Z.  
F1-OE#  
F2-OE#  
Input  
Input  
F1-OE# and F2-OE# should be tied together for all densities.  
RESET: Active low input. RST# resets internal automation and inhibits write operations. This  
provides data protection during power transitions. RST# high enables normal operation. Exit from  
reset places the device in asynchronous read array mode.  
RST#  
WAIT: Indicates data valid in synchronous array or non-array burst reads. Read Configuration  
Register bit 10 (RCR[10], WT) determines its polarity when asserted. WAIT’s active output is V or  
OL  
V
when CE# and OE# are V . WAIT is high-Z if CE# or OE# is V .  
OH  
IL IH  
WAIT  
WE#  
Output  
Input  
In synchronous array or non-array read modes, WAIT indicates invalid data when asserted and  
valid data when deasserted.  
In asynchronous page mode, and all write modes, WAIT is deasserted.  
WRITE ENABLE: Active low input. WE# controls writes to the device. Address and data are latched  
on the rising edge of WE#.  
Datasheet  
Intel StrataFlash® Embedded Memory (P30)  
Order Number: 306666, Revision: 001  
April 2005  
21  
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