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EPM3064ATC100-7N 参数 Datasheet PDF下载

EPM3064ATC100-7N图片预览
型号: EPM3064ATC100-7N
PDF下载: 下载PDF文件 查看货源
内容描述: [EE PLD, 7.5ns, 64-Cell, CMOS, PQFP100, TQFP-100]
分类和应用: 时钟输入元件可编程逻辑
文件页数/大小: 46 页 / 711 K
品牌: INTEL [ INTEL ]
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MAX 3000A Programmable Logic Device Family Data Sheet  
Figure 8. MAX 3000A AC Test Conditions  
Power supply transients can affect AC  
measurements. Simultaneous transitions  
of multiple outputs should be avoided for  
accurate measurement. Threshold tests  
must not be performed under AC  
VCC  
703 Ω  
[521 Ω]  
conditions. Large–amplitude, fast–  
ground–current transients normally occur  
as the device outputs discharge the load  
capacitances. When these transients flow  
through the parasitic inductance between  
the device ground pin and the test system  
ground, significant reductions in  
observable noise immunity can result.  
Numbers in brackets are for 2.5–V  
outputs. Numbers without brackets are for  
3.3–V devices or outputs.  
Device  
Output  
To Test  
System  
620 Ω  
[481 Ω]  
C1 (includes jig  
capacitance)  
Device input  
rise and fall  
times < 2 ns  
Tables 12 through 15 provide information on absolute maximum ratings,  
recommended operating conditions, DC operating conditions, and  
capacitance for MAX 3000A devices.  
Operating  
Conditions  
Table 12. MAX 3000A Device Absolute Maximum Ratings  
Note (1)  
Symbol Parameter Conditions  
Min  
Max  
Unit  
V
V
Supply voltage  
With respect to ground (2)  
–0.5  
–2.0  
–25  
–65  
–65  
4.6  
5.75  
25  
V
CC  
DC input voltage  
V
I
I
DC output current, per pin  
Storage temperature  
Ambient temperature  
Junction temperature  
mA  
° C  
° C  
° C  
OUT  
T
T
T
No bias  
150  
135  
135  
STG  
A
Under bias  
PQFP and TQFP packages, under bias  
J
22  
Altera Corporation  
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