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EPM1270GM100I5ES 参数 Datasheet PDF下载

EPM1270GM100I5ES图片预览
型号: EPM1270GM100I5ES
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash PLD, PBGA100, 6 X 6 MM, 0.50 MM PITCH, MICRO, FBGA-100]
分类和应用:
文件页数/大小: 98 页 / 1060 K
品牌: INTEL [ INTEL ]
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Power-On Reset Circuitry  
Figure 4–4. ESD Protection During Negative Voltage Zap  
I/O  
Source  
D
Gate  
PMOS  
N+  
Drain  
P-Substrate  
G
I/O  
Drain  
S
Gate  
N+  
NMOS  
Source  
GND  
GND  
MAX II devices have POR circuits to VCCINT and VCCIO voltage levels  
during power-up. The POR circuit monitors these voltages, triggering  
download from the non-volatile configuration flash memory (CFM) block  
to the SRAM logic, maintaining tri-state of the I/O pins (with weak pull-  
up resistors enabled) before and during this process. When the MAX II  
device enters user mode, the POR circuit releases the I/O pins to user  
functionality and continues to monitor the VCCINT voltage level to detect  
a brown-out condition.  
Power-On Reset  
Circuitry  
Power-Up Characteristics  
When power is applied to a MAX II device, the POR circuit monitors  
VCCINT and begins SRAM download at an approximate voltage of 1.7 V,  
or 1.55 V for MAX II G devices. From this voltage reference, SRAM  
download and entry into user mode takes 200 to 450 µs maximum  
depending on device density. This period of time is specified as tCONFIG in  
the power-up timing section of Chapter 5. DC & Switching Characteristics.  
Entry into user mode is gated by whether all VCCIO banks are powered  
with sufficient operating voltage. If VCCINT and VCCIO are powered  
simultaneously, the device enters user mode within the tCONFIG  
4–6  
Core Version a.b.c variable  
Altera Corporation  
February 2006  
MAX II Device Handbook, Volume 1