Electrical Specifications
Figure 2-3. VCC Overshoot Example Waveform
Example Overshoot Waveform
VID + 0.050
VID
VOS
TOS
Time
TOS: Overshoot time above VID
VOS: Overshoot above VID
NOTES:
1. V is measured overshoot voltage.
OS
2. T is measured time duration above VID.
OS
2.12.1
Die Voltage Validation
Overshoot events from application testing on real processors must meet the specifications in
Table 2-17 when measured across the VCC_SENSE and VSS_SENSE pins. Overshoot events that
are < 10 ns in duration may be ignored. These measurements of processor die level overshoot
should be taken with a 100 MHz bandwidth limited oscilloscope.
Datasheet
29
INTEL [ INTEL ]
