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317607-001 参数 Datasheet PDF下载

317607-001图片预览
型号: 317607-001
PDF下载: 下载PDF文件 查看货源
内容描述: Express芯片组 [Express Chipset]
分类和应用:
文件页数/大小: 351 页 / 2481 K
品牌: INTEL [ INTEL ]
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Testability  
13.1  
XOR Test Mode Initialization  
Figure 13-1. XOR Test Mode Initialization Cycles  
The above figure shows the wave forms to be able to boot the part into XOR mode.  
The straps that need to be controlled during this boot process are BSEL[2:0],  
SDVO_CTRLDATA, EXP_EM, EXP_SLR, and XORTEST.  
On G35 platforms, all strap values must be driven before PWROK asserts. BSEL0 must  
be a 1. BSEL[2:1] need to be defined values, but logic value in any order will do.  
XORTEST must be driven to 0.  
If sDVO is present in the design, SDVO_CTRLDATA must be pulled to logic 1.  
Depending on if Static Lane Reversal is used and if the sDVO/PCIe Coexistence is  
selected, EXP_SLR and EXP_EN must be pulled in a valid manner.  
Because of the different functionalities of the sDVO/PCIe interface, not all of the pins  
will be used in all implementations. Due to the need to minimize test points and  
unnecessary routing, the XOR Chain 14 is dynamic depending on the values of  
SDVO_CTRLDATA, EXP_SLR, and EXP_EN. Please see the below table for what parts of  
XOR Chain 14 become valid XOR inputs depending on the use of SDVO_CTRLDATA,  
EXP_SLR, and EXP_EN.  
340  
Datasheet  
 
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