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3000 参数 Datasheet PDF下载

3000图片预览
型号: 3000
PDF下载: 下载PDF文件 查看货源
内容描述: 双核英特尔​​®至强®处理器 [Dual-Core Intel Xeon Processor]
分类和应用: 连接器
文件页数/大小: 102 页 / 2420 K
品牌: INTEL [ INTEL ]
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Electrical Specifications  
The TESTHI signals may use individual pull-up resistors or be grouped together as  
detailed below. A matched resistor must be used for each group:  
• TESTHI[1:0]  
• TESTHI[7:2]  
• TESTHI8/FC42 – cannot be grouped with other TESTHI signals  
• TESTHI9/FC43 – cannot be grouped with other TESTHI signals  
• TESTHI10 – cannot be grouped with other TESTHI signals  
• TESTHI11 – cannot be grouped with other TESTHI signals  
• TESTHI12/FC44 – cannot be grouped with other TESTHI signals  
• TESTHI13 – cannot be grouped with other TESTHI signals  
However, utilization of boundary scan test will not be functional if these lands are  
connected together. For optimum noise margin, all pull-up resistor values used for  
TESTHI[13:0] lands should have a resistance value within ± 20% of the impedance of  
the board transmission line traces. For example, if the nominal trace impedance is 50 Ω,  
then a value between 40 Ω and 60 Ω should be used.  
2.6  
Voltage and Current Specification  
2.6.1  
Absolute Maximum and Minimum Ratings  
Table 2-3 specifies absolute maximum and minimum ratings only and lie outside the  
functional limits of the processor. Within functional operation limits, functionality and  
long-term reliability can be expected.  
At conditions outside functional operation condition limits, but within absolute  
maximum and minimum ratings, neither functionality nor long-term reliability can be  
expected. If a device is returned to conditions within functional operation limits after  
having been subjected to conditions outside these limits, but within the absolute  
maximum and minimum ratings, the device may be functional, but with its lifetime  
degraded depending on exposure to conditions exceeding the functional operation  
condition limits.  
At conditions exceeding absolute maximum and minimum ratings, neither functionality  
nor long-term reliability can be expected. Moreover, if a device is subjected to these  
conditions for any length of time then, when returned to conditions within the  
functional operating condition limits, it will either not function, or its reliability will be  
severely degraded.  
Although the processor contains protective circuitry to resist damage from static  
electric discharge, precautions should always be taken to avoid high static voltages or  
electric fields.  
Dual-Core Intel® Xeon® Processor 3000 Series Datasheet  
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