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28F400BX-TB 参数 Datasheet PDF下载

28F400BX-TB图片预览
型号: 28F400BX-TB
PDF下载: 下载PDF文件 查看货源
内容描述: 4兆位( 256K X 16 , 512K ×8 ), BOOT BLOCK闪存系列 [4-MBIT (256K X 16, 512K X 8) BOOT BLOCK FLASH MEMORY FAMILY]
分类和应用: 闪存
文件页数/大小: 50 页 / 560 K
品牌: INTEL [ INTEL ]
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28F400BX-T/B, 28F004BX-T/B  
1.6 28F004BX Pin Descriptions  
Symbol  
A A  
Type  
I
Name and Function  
ADDRESS INPUTS for memory addresses. Addresses are internally latched during  
a write cycle.  
0
18  
A
I
ADDRESS INPUT: When A is at 12V the signature mode is accessed. During this  
9
mode A decodes between the manufacturer and device ID’s.  
9
0
Ý
Ý
DATA INPUTS/OUTPUTS: Inputs array data on the second CE and WE cycle  
during a program command. Inputs commands to the command user interface when  
DQ DQ  
0
I/O  
7
Ý
Ý
CE and WE are active. Data is internally latched during the write and program  
cycles. Outputs array, Intelligent Identifier and status register data. The data pins  
float to tri-state when the chip is deselected or the outputs are disabled.  
Ý
Ý
CE  
RP  
I
I
CHIP ENABLE: Activates the device’s control logic, input buffers, decoders and  
Ý
Ý
sense amplifiers. CE is active low; CE high deselects the memory device and  
Ý
Ý
reduces power consumption to standby levels. If CE and RP are high, but not at  
a CMOS high level, the standby current will increase due to current flow through the  
Ý
Ý
CE and RP input stages.  
RESET/DEEP POWERDOWN: Provides Three-State control. Puts the device in  
deep power-down mode. Locks the Boot Block from program/erase.  
Ý
When RP is at logic high level and equals 6.5V maximum the Boot Block is locked  
and cannot be programmed or erased.  
e
Ý
When RP  
or erased.  
11.4V minimum the Boot Block is unlocked and can be programmed  
Ý
When RP is at a logic low level the Boot Block is locked, the deep power-down  
mode is enabled and the WSM is reset preventing any blocks from being  
programmed or erased, therefore providing data protection during power transitions.  
Ý
When RP transitions from logic low to logic high, the flash memory enters the  
read-array mode.  
Ý
OE  
I
I
OUTPUT ENABLE: Gates the device’s outputs through the data buffers during a  
Ý
read cycle. OE is active low.  
Ý
Ý
WE  
WRITE ENABLE: Controls writes to the Command Register and array blocks. WE  
Ý
is active low. Addresses and data are latched on the rising edge of the WE pulse.  
V
PROGRAM/ERASE POWER SUPPLY: For erasing memory array blocks or  
programming data in each block.  
PP  
k
NOTE: V  
PP  
V
memory contents cannot be altered.  
PPLMAX  
g
g
DEVICE POWER SUPPLY (5V 10%, 5V 5%)  
V
CC  
GND  
NC  
GROUND: For all internal circuitry.  
NO CONNECT: Pin may be driven or left floating.  
DON’T USE PIN: Pin should not be connected to anything.  
DU  
10