PEB 2091
PEF 2091
Operational Description
4.6
Chip Internal Test Options
The IEC-Q permits limited access to internal test procedures and internal data. This
chapter explains how these tests can be performed.
4.6.1
Self-Test
Note 52: This section applies only in the NT, NT-PBX and TE modes.
This test can be requested by the terminal in order to verify correct performance. The
self-test is started with the MON-1-command ST. No tests are performed within the
IEC-Q. If the ST-message has been received correctly, the device returns the
MON-1-message STP (self-test passed) to the terminal. With this function the terminal
has a possibility to verify the existence of a layer-1 device.
Initialization (NT side)
MON-1
0
ST
0
Self Test
0
0
1
0
0
0
0
0
0
0
1
0
x
x
x
x
x
x
x
x
Acknowledgment (NT side)
MON-1
STP
0
Self Test Pass
0
0
0
1
0
0
0
0
1
x:
Do not care
For more information about MON-1 commands and codes, see "MON-1 Codes", page
227.
4.6.2
Receiver Coefficient Values
Some of the internal chip registers can be read via MON-8-messages.
Of interest to the user are the values of the coefficients for equalizer and echo canceller.
This information will however only proof useful if a detailed, theoretical chip knowledge
exists.
Registers are read by sending a two-byte MON-8 message RCOEF. The first byte
identifies the command as an internal register access, the second addresses the
register.
The 16-bit register value is returned in two MON-8 messages DCOEF of two bytes each.
Table 31 shows the address range for equalizer (26 coefficients) and echo canceller
coefficients (36 coefficients).
Semiconductor Group
185
Data Sheet 01.99
INFINEON [ Infineon ]
