IDT7005S/L
HIGH-SPEED 8K x 8 DUAL-PORT STATIC RAM
MILITARY AND COMMERCIAL TEMPERATURE RANGES
5V
5V
1250Ω
DATA
OUT
1250Ω
DATA
OUT
775Ω
30pF
775Ω
5pF
AC TEST CONDITIONS
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
GND to 3.0V
5ns Max.
1.5V
1.5V
Figure 1 and 2
2738 tbl 12
BUSY
INT
2738 drw 06
Figure 1. AC Output Test Load
Figure 2. Output Load
(For t
LZ
, t
HZ
, t
WZ
, t
OW
)
Including scope and jig
AC ELECTRICAL CHARACTERISTICS OVER THE
OPERATING TEMPERATURE AND SUPPLY VOLTAGE RANGE
(4)
IDT7005X15
Com'l. Only
Min. Max.
15
—
—
—
3
3
0
15
10
15
—
10
—
15
15
10
IDT7005X17
Com'l. Only
Min.
Max.
17
—
—
—
3
3
—
0
—
10
—
—
17
17
10
—
—
10
—
17
—
17
IDT7005X20
Min.
20
—
—
—
3
3
—
0
—
10
—
Max.
—
20
20
12
—
—
12
—
20
—
20
IDT7005X25
Min.
25
—
—
—
3
3
—
0
—
10
—
Max.
—
25
25
13
—
—
15
—
25
—
25
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Symbol
Parameter
Read Cycle Time
Address Access Time
Chip Enable Access Time
(3)
Output Enable Access Time
Output Hold from Address Change
Output Low-Z Time
(1, 2)
(1, 2)
READ CYCLE
t
RC
t
AA
t
ACE
t
AOE
t
OH
t
LZ
t
HZ
t
PU
t
PD
t
SOP
t
SAA
Output High-Z Time
Chip Enable to Power Up Time
(2)
Chip Disable to Power Down Time
(2)
Semaphore Flag Update Pulse (
OE
or
SEM
)
Semaphore Address Access Time
IDT7005X35
Symbol
IDT7005X55
Min.
55
—
—
—
3
3
—
0
—
15
—
Max.
—
55
55
30
—
—
25
—
50
—
55
Parameter
Read Cycle Time
Address Access Time
Chip Enable Access Time
(3)
Output Enable Access Time
Output Hold from Address Change
Output Low-Z Time
(1, 2)
Min.
35
—
—
—
3
3
—
0
—
15
—
Max.
—
35
35
20
—
—
15
—
35
—
35
IDT7005X70
Mil. Only
Min.
Max.
70
—
—
—
3
3
—
0
—
15
—
—
70
70
35
—
—
30
—
50
—
70
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
2738 tbl 13
READ CYCLE
t
RC
t
AA
t
ACE
t
AOE
t
OH
t
LZ
t
HZ
t
PU
t
PD
t
SOP
t
SAA
Output High-Z Time
(1, 2)
Chip Enable to Power Up Time
(2)
Chip Disable to Power Down Time
(2)
Semaphore Flag Update Pulse (
OE
or
SEM
)
Semaphore Address Access Time
NOTES:
1. Transition is measured
±500mV
from Low or High-impedance voltage with Output Test Load (Figures 2).
2. This parameter is guaranteed by device characterization but not production tested.
3. To access RAM,
CE
= V
IL and
SEM
= V
IH
. To access semaphore,
CE
= V
IH and
SEM
= V
IL.
4. "X" in part numbers indicates power rating (S or L).
6.06
7
IDT [ INTEGRATED DEVICE TECHNOLOGY ]
