IDT7005S/L
HIGH-SPEED 8K x 8 DUAL-PORT STATIC RAM
MILITARY AND COMMERCIAL TEMPERATURE RANGES
5V 5V
AC TEST CONDITIONS
1250Ω
Input Pulse Levels
GND to 3.0V
5ns Max.
1.5V
1250Ω
DATAOUT
BUSY
INT
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
DATAOUT
775Ω
5pF
775Ω
30pF
1.5V
Figure 1 and 2
2738 drw 06
2738 tbl 12
Figure 2. Output Load
(For tLZ, tHZ, tWZ, tOW)
Figure 1. AC Output Test Load
Including scope and jig
AC ELECTRICAL CHARACTERISTICS OVER THE
OPERATING TEMPERATURE AND SUPPLY VOLTAGE RANGE(4)
IDT7005X15
Com'l. Only
Min. Max.
IDT7005X17
Com'l. Only
IDT7005X20
IDT7005X25
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max. Unit
READ CYCLE
tRC
tAA
Read Cycle Time
15
—
—
—
3
—
15
15
10
17
—
—
—
3
—
17
17
10
—
—
10
—
17
—
17
20
—
—
—
3
—
20
20
12
—
—
12
—
20
—
20
25
—
—
—
3
—
25
25
13
—
—
15
—
25
—
25
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Address Access Time
tACE
tAOE
tOH
tLZ
Chip Enable Access Time(3)
Output Enable Access Time
Output Hold from Address Change
Output Low-Z Time(1, 2)
3
—
3
3
3
tHZ
Output High-Z Time(1, 2)
10
—
0
—
0
—
0
tPU
Chip Enable to Power Up Time(2)
Chip Disable to Power Down Time(2)
Semaphore Flag Update Pulse (OE or SEM)
Semaphore Address Access Time
0
tPD
15
15
—
10
—
—
10
—
—
10
—
tSOP
tSAA
10
IDT7005X35
IDT7005X55
IDT7005X70
Mil. Only
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max. Unit
READ CYCLE
tRC
tAA
Read Cycle Time
35
—
—
—
3
—
35
35
20
—
—
15
—
35
—
35
55
—
—
—
3
—
55
55
30
—
—
25
—
50
—
55
70
—
—
—
3
—
70
70
35
—
—
30
—
50
—
70
ns
ns
Address Access Time
tACE
tAOE
tOH
tLZ
Chip Enable Access Time(3)
Output Enable Access Time
Output Hold from Address Change
Output Low-Z Time(1, 2)
ns
ns
ns
3
3
3
ns
tHZ
Output High-Z Time(1, 2)
—
0
—
0
—
0
ns
tPU
Chip Enable to Power Up Time(2)
Chip Disable to Power Down Time(2)
Semaphore Flag Update Pulse (OE or SEM)
Semaphore Address Access Time
ns
tPD
—
15
—
—
15
—
—
15
—
ns
tSOP
tSAA
ns
ns
NOTES:
2738 tbl 13
1. Transition is measured ±500mV from Low or High-impedance voltage with Output Test Load (Figures 2).
2. This parameter is guaranteed by device characterization but not production tested.
3. To access RAM, CE = VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL.
4. "X" in part numbers indicates power rating (S or L).
6.06
7
IDT [ INTEGRATED DEVICE TECHNOLOGY ]
