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23S09E-1HDCG 参数 Datasheet PDF下载

23S09E-1HDCG图片预览
型号: 23S09E-1HDCG
PDF下载: 下载PDF文件 查看货源
内容描述: 3.3V零延迟时钟缓冲器,扩频兼容 [3.3V ZERO DELAY CLOCK BUFFER, SPREAD SPECTRUM COMPATIBLE]
分类和应用: 时钟
文件页数/大小: 8 页 / 69 K
品牌: IDT [ INTEGRATED DEVICE TECHNOLOGY ]
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IDT23S09E
3.3V ZERO DELAY CLOCK BUFFER
COMMERCIAL AND INDUSTRIAL TEMPERATURE RANGES
3.3V ZERO DELAY
CLOCK BUFFER, SPREAD
SPECTRUM COMPATIBLE
FEATURES:
DESCRIPTION:
IDT23S09E
• Phase-Lock Loop Clock Distribution
• 10MHz to 200MHz operating frequency
• Distributes one clock input to one bank of five and one bank of
four outputs
• Separate output enable for each output bank
• Output Skew < 250ps
• Low jitter <200 ps cycle-to-cycle
• IDT23S09E-1 for Standard Drive
• IDT23S09E-1H for High Drive
• No external RC network required
• Operates at 3.3V V
DD
• Spread spectrum compatible
• Available in SOIC and TSSOP packages
The IDT23S09E is a high-speed phase-lock loop (PLL) clock buffer,
designed to address high-speed clock distribution applications. The zero
delay is achieved by aligning the phase between the incoming clock and
the output clock, operable within the range of 10 to 200MHz.
The IDT23S09E is a 16-pin version of the IDT23S05E. The IDT23S09E
accepts one reference input, and drives two banks of four low skew clocks.
The -1H version of this device operates up to 200MHz frequency and has
higher drive than the -1 device. All parts have on-chip PLLs which lock
to an input clock on the REF pin. The PLL feedback is on-chip and is
obtained from the CLKOUT pad. In the absence of an input clock, the
IDT23S09E enters power down. In this mode, the device will draw less
than 12µA for Commercial Temperature range and less than 25µA for
Industrial temperature range, and the outputs are tri-stated.
The IDT23S09E is characterized for both Industrial and Commercial
operation.
FUNCTIONAL BLOCK DIAGRAM
16
CLKOUT
1
REF
PLL
2
CLKA1
3
CLKA2
14
CLKA3
15
CLKA4
S2
S1
8
9
Control
Logic
6
CLKB1
7
CLKB2
10
CLKB3
11
CLKB4
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
COMMERCIAL AND INDUSTRIAL TEMPERATURE RANGES
1
c
2006 Integrated Device Technology, Inc.
MAY 2010
DSC - 6399/11