Integrated
Circuit
Systems, Inc.
ICS8304-01
L
OW
S
KEW
, 1-
TO
-4
LVCMOS / LVTTL I
NVERTING
F
ANOUT
B
UFFER
4.6V
-0.5V to V
DD
+ 0.5 V
-0.5V to V
DDO
+ 0.5V
112.7°C/W (0 lfpm)
-65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions be-
yond those listed in the
DC Characteristics
or
AC Character-
istics
is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.
A
BSOLUTE
M
AXIMUM
R
ATINGS
Supply Voltage, V
DD
Inputs, V
DD
Outputs, V
DDO
Package Thermal Impedance,
θ
JA
Storage Temperature, T
STG
X
T
ABLE
3A. P
OWER
S
UPPLY
DC C
HARACTERISTICS
,
V
DD
= V
DDO
= 3.3V±5%, T
A
= 0°C
TO
70°C
Symbol
V
DD
V
DDO
I
DD
I
DDO
Parameter
Core Supply Voltage
Output Power Supply Voltage
Power Supply Current
Output Supply Current
Test Conditions
Minimum
3.135
3.135
Typical
3.3
3.3
Maximum
3.465
3.465
15
8
Units
V
V
mA
mA
T
ABLE
3B. LVCMOS / LVTTL DC C
HARACTERISTICS
,
V
DD
= V
DDO
= 3.3V±5%, T
A
= 0°C
TO
70°C
Symbol
V
IH
V
IL
I
IH
I
IL
V
OH
Parameter
Input High Voltage
Input Low Voltage
Input High Current
Input Low Current
Output High Voltage; NOTE 1
V
DD
= V
IN
= 3.465V
V
DD
= 3.465V, V
IN
= 0V
-5
2.6
0.5
Test Conditions
Minimum
2
-0.3
Typical
Maximum
V
DD
+ 0.3
1.3
150
Units
V
V
µA
µA
V
V
Output Low Voltage; NOTE 1
V
OL
NOTE 1: Outputs terminated with 50
Ω
to V
DDO
/2. See Parameter Measurement Information Section",
"3.3V Output Load Test Circuit".
T
ABLE
4A. AC C
HARACTERISTICS
,
V
DD
= V
DDO
= 3.3V±5%, T
A
= 0°C
TO
70°C
Symbol Parameter
f
MAX
t
PD
Output Frequency
Propagation Delay; NOTE 1
Output Skew; NOTE 2, 4
Par t-to-Par t Skew; NOTE 3, 4
Output Rise Time
Output Fall Time
30% to 70%
30% to 70%
250
250
IJ 166MHz
2.3
Test Conditions
Minimum
Typical
Maximum
166
3.5
50
600
500
500
60
Units
MHz
ns
ps
ps
ps
ps
%
t
sk(o)
t
sk(pp)
t
R
t
F
odc
Output Duty Cycle
f
≤
166MHz
40
All parameters measured at 166MHz unless noted otherwise.
NOTE 1: Measured from V
DD
/2 of the input to V
DDO
/2 of the output. Measured from the rising edge of
the input to the falling edge of the output.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at V
DDO
/2.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured
at V
DDO
/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
8304AM-01
www.icst.com/products/hiperclocks.html
3
REV. D MAY 23, 2005
ICS [ INTEGRATED CIRCUIT SYSTEMS ]
