PRELIMINARY
Integrated
Circuit
Systems, Inc.
ICS840001-31
F
EMTO
C
LOCKS
™ C
RYSTAL
-
TO
-
LVCMOS/LVTTL F
REQUENCY
S
YNTHESIZER
4.6V
-0.5V to V
DD
+ 0.5 V
-0.5V to V
DD
+ 0.5V
51.5°C/W (0 lfpm)
-65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions be-
yond those listed in the
DC Characteristics
or
AC Character-
istics
is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.
A
BSOLUTE
M
AXIMUM
R
ATINGS
Supply Voltage, V
DD
Inputs, V
I
Outputs, V
O
Package Thermal Impedance,
θ
JA
Storage Temperature, T
STG
T
ABLE
4A. P
OWER
S
UPPLY
DC C
HARACTERISTICS
,
V
DD
= V
DDA
= V
DDO
= 3.3V±5%, T
A
= 0°C
TO
70°C
Symbol
V
DD
V
DDA
V
DDO
I
DD
I
DDA
I
DDO
Parameter
Core Supply Voltage
Analog Supply Voltage
Output Supply Voltage
Power Supply Current
Analog Supply Current
Output Supply Current
Test Conditions
Minimum
3.135
3.135
3.135
Typical
3.3
3.3
3.3
70
6
27
Maximum
3.465
3.465
3.465
Units
V
V
V
mA
mA
mA
T
ABLE
4B. LVCMOS/LVTTL DC C
HARACTERISTICS
,
V
DD
= V
DDA
= V
DDO
= 3.3V±5%, T
A
= 0°C
TO
70°C
Symbol
V
IH
V
IL
I
IH
I
IL
V
OH
Parameter
Input High Voltage
Input Low Voltage
Input High Current
Input Low Current
OE, M
OE, M
V
DD
= V
IN
= 3.465V
V
DD
= 3.465V, V
IN
= 0V
-150
2.6
0.5
Test Conditions
Minimum
2
-0.3
Typical
Maximum
V
DD
+ 0.3
0.8
5
Units
V
V
µA
µA
V
V
Output High Voltage; NOTE 1
Output Low Voltage; NOTE 1
V
OL
NOTE 1: Outputs terminated with 50
Ω
to V
DD
/2. See Parameter Measurement Information Section,
"3.3V Output Load Test Circuit".
T
ABLE
5. C
RYSTAL
C
HARACTERISTICS
Parameter
Mode of Oscillation
Frequency
Equivalent Series Resistance (ESR)
Shunt Capacitance
Drive Level
26.5625
Test Conditions
Minimum
Typical
Fundamental
40
50
7
1
MHz
Ω
pF
mW
Maximum
Units
840001AK-31
www.icst.com/products/hiperclocks.html
3
REV. A MAY 4, 2005
ICS [ INTEGRATED CIRCUIT SYSTEMS ]
