PRELIMINARY
Integrated
Circuit
Systems, Inc.
ICS83032I
75MH
Z
, 3
RD
O
VERTONE
O
SCILLATOR
W
/D
UAL
LVCMOS/LVTTL O
UTPUTS
Test Conditions
Minimum
53
Typical
3
rd
Over tone
75
60
±30
±30
18
7
±15
1
80
MHz
Ω
ppm
ppm
pF
pF
ppm
mW
Maximum
Units
T
ABLE
5. C
RYSTAL
C
HARACTERISTICS
(NOTE 1)
Parameter
Mode of Oscillation
Frequency
Equivalent Series Resistance (ESR)
Frequency Tolerance
Frequency Stability Over Operating
Temperature Range
Load Capacitance (C
L
); NOTE 2
Shunt Capacitance (C
O
)
Aging for 5 Years
Drive Level
NOTE 1: Using an HC49/US SMD package, the parameters shown above target ±100ppm accuracy.
NOTE 2: See
Cr ystal Input Interface
in the Application Information Section.
T
ABLE
6A. AC C
HARACTERISTICS
,
V
DD
= 3.3V±0.3V, T
A
= -40°C
TO
85°C
Symbol
f
OUT
t
jit(Ø)
t
DJ
t
RJ
t
RMS
t
p-p
t
acc
tsk(o)
Δ
f/f
O
t
OSC
t
R
/ t
F
Parameter
Output Frequency
RMS Phase Jitter, Random;
NOTE 1
Deterministic Jitter ; NOTE 2
Random Jitter ; NOTE 2
RMS of Total Distribution (
σ
);
NOTE 2
Peak-to-Peak Jitter ; NOTE 2
Accumulated Jitter (
σ
);
NOTE 2
Output Skew; NOTE 3, 4
Frequency Stability; NOTE 5
Oscillation Star t Up Time
Output Rise/Fall Time
20% to 80%
350
Test Conditions
fOUT = 75MHz,
(Integration Range: 900kHz-7.5MHz)
Minimum
53
Typical
75
<125
0.2
3
3
25
n = 2 to 50000 cycles
4
5
±10
10
Maximum
80
Units
MH z
fs
ps
ps
ps
ps
ps
ps
ppm
ms
ps
odc
Output Duty Cycle
50
%
NOTE 1: Measured using Aeroflex PN9500.
NOTE 2: Measured using Wavecrest SIA-3000.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at V
DD
/2.
NOTE 4: These parameters are guaranteed by characterization. Not tested in production.
NOTE 5: This is the frequency error contributed by the oscillator and must be added to the frequency timing error from the
cr ystal to obtain the total frequency stability. See
Frequency Stability
in the Application Information Section.
83032AGI
www.icst.com/products/hiperclocks.html
4
REV. B FEBRUARY 13, 2006
ICS [ INTEGRATED CIRCUIT SYSTEMS ]
