欢迎访问ic37.com |
会员登录 免费注册
发布采购

H5PS1G83EFR 参数 Datasheet PDF下载

H5PS1G83EFR图片预览
型号: H5PS1G83EFR
PDF下载: 下载PDF文件 查看货源
内容描述: 1GB DDR2 SDRAM [1Gb DDR2 SDRAM]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 44 页 / 566 K
品牌: HYNIX [ HYNIX SEMICONDUCTOR ]
 浏览型号H5PS1G83EFR的Datasheet PDF文件第33页浏览型号H5PS1G83EFR的Datasheet PDF文件第34页浏览型号H5PS1G83EFR的Datasheet PDF文件第35页浏览型号H5PS1G83EFR的Datasheet PDF文件第36页浏览型号H5PS1G83EFR的Datasheet PDF文件第38页浏览型号H5PS1G83EFR的Datasheet PDF文件第39页浏览型号H5PS1G83EFR的Datasheet PDF文件第40页浏览型号H5PS1G83EFR的Datasheet PDF文件第41页  
H5PS1G43EFR  
H5PS1G83EFR  
H5PS1G63EFR  
19. tRPST end point and tRPRE begin point are not referenced to a specific voltage level but specify when  
the device output is no longer driving (tRPST), or begins driving (tRPRE). Below figure shows a method to  
calculate these points when the device is no longer driving (tRPST), or begins driving (tRPRE). Below Fig-  
ure shows a method to calculate these points when the device is no longer driving (tRPST), or begins driv-  
ing (tRPRE) by measuring the signal at two different voltages. The actual voltage measurement points are  
not critical as long as the calculation is consistent.  
VOH + xmV  
VTT + 2xmV  
VTT + xmV  
VOH + 2xmV  
tHZ  
tLZ  
tRPST end point  
tRPRE begin point  
T1  
T2  
VOL + 1xmV  
VOL + 2xmV  
VTT -xmV  
T1  
VTT - 2xmV  
T2  
tHZ , tRPST end point = 2*T1-T2  
tLZ , tRPRE begin point = 2*T1-T2  
20. Input waveform timing with differential data strobe enabled MR[bit10] =0, is referenced from the input  
signal crossing at the V (ac) level to the differential data strobe crosspoint for a rising signal, and from  
IH  
the input signal crossing at the V (ac) level to the differential data strobe crosspoint for a falling signal  
IL  
applied to the device under test.  
21. Input waveform timing with differential data strobe enabled MR[bit10]=0, is referenced from the input  
signal crossing at the V (dc) level to the differential data strobe crosspoint for a rising signal and V (dc)  
IH  
IL  
to the differential data strobe crosspoint for a falling signal applied to the device under test.  
Differential Input waveform timing  
DQS  
DQS  
tDS tDH  
tDS tDH  
VDDQ  
VIH(ac)min  
VIH(dc)min  
VREF(dc)  
VIL(dc)max  
VIL(ac)max  
VSS  
Rev. 0.4 / Nov 2008  
37  
 复制成功!