+5 V
I
I
PULSE GEN.
= 50 Ω
V
1
2
3
4
8
7
6
5
CC
Z
O
t
= t = 5 ns
r
f
0.1µF
BYPASS
R
L
OUTPUT V
MONITORING
NODE
INPUT
MONITORING
NODE
O
100
80
V
I
= 5 V
CC
I = 7.5 mA
*C
L
t
, R = 4 KΩ
L
R
PLH
M
GND
t
, R = 350 Ω
L
PHL
1 KΩ
4 KΩ
60
40
*C IS APPROXIMATELY 15 pF WHICH INCLUDES
L
PROBE AND STRAY WIRING CAPACITANCE.
t
, R = 1 KΩ
L
PLH
I
I
= 7.50 mA
= 3.75 mA
t
, R = 350 Ω
L
PLH
INPUT
20
0
I
I
I
I
t
t
PHL
PLH
-60 -40 -20
0
20 40
80 100
60
OUTPUT
V
O
1.5 V
T
– TEMPERATURE – °C
A
Figure 6. Test Circuit for tPHL and tPLH
.
Figure 7. Typical Propagation Delay
vs. Temperature.
105
40
30
20
10
V
T
= 5 V
CC
= 25°C
R
= 4 kΩ
L
A
t
, R = 4 KΩ
L
90
PLH
V
I
= 5 V
CC
I = 7.5 mA
75
60
t
, R = 350 Ω
L
R
= 350 kΩ
PLH
L
t
, R = 1 KΩ
L
PLH
45
30
0
t
, R = 350 Ω
PHL
L
R
= 1 kΩ
L
1 KΩ
4 KΩ
-10
5
7
9
11
13
15
-60 -40 -20
0
20 40
80 100
60
I – PULSE INPUT CURRENT – mA
T
– TEMPERATURE – °C
I
A
Figure 8. Typical Propagation Delay
vs. Pulse Input Current.
Figure 9. Typical Pulse Width
Distortion vs. Temperature.
PULSE GEN.
Z
= 50 Ω
r
O
INPUT V
MONITORING NODE
E
t
= t = 5 ns
f
+5 V
V
CC
1
8
7.5 mA
0.1 µF
BYPASS
R
L
2
3
4
7
6
5
I
I
120
OUTPUT V
MONITORING
NODE
O
V
V
V
= 5 V
= 3 V
= 0 V
CC
EH
EL
*C
L
I = 7.5 mA
I
90
60
GND
t
, R = 4 kΩ
L
ELH
*C IS APPROXIMATELY 15 pF WHICH INCLUDES
L
PROBE AND STRAY WIRING CAPACITANCE.
t
, R = 1 kΩ
L
ELH
3.0 V
30
0
INPUT
t
, R = 350 Ω
ELH
L
1.5 V
V
E
t
, R = 350 Ω, 1 kΩ, 4 kΩ
EHL
t
L
t
EHL
ELH
-60 -40 -20
0
20 40 60 80 100
OUTPUT
T
– TEMPERATURE – °C
V
A
O
1.5 V
Figure 11. Typical Enable Propagation
Delay vs. Temperature.
Figure 10. Test Circuit for tEHL and tELH
.
1-323
HP [ HEWLETT-PACKARD ]
