Test Circuit Diagrams
Unless otherwise noted, all test circuits are at T
A
= 25°C, V
CC
= 5 V,
sinusoidal waveform input, and signal frequency f = 132 kHz.
20 kΩ
1 µF
SCOPE
5V
V
IN
= 1.25 V
PP
100 nF
10 kΩ
R
ref
1
2
3
4
Status
Tx -en
Tx -in
R
ref
Tx -out
V
CC
GND
GND
8
7
6
5
100 µF
100 nF
5V
R
L
2.5
Ω
HCPL-8100/0810
Figure 13. Load detection test circuit.
20 k
Ω
1 µF
1
5V
100 nF
10 k
Ω
V
IN
= 1 V
PP
f = 10 k ~ 10 MHz
R
ref
24 k
Ω
2
3
4
Status
Tx -en
Tx -in
R
ref
Tx -out
V
CC
GND
GND
8
7
6
5
100 µF
100 nF
5V
V
OUT
R
L
50
Ω
HCPL-8100/0810
Figure 14. Gain bandwidth product test circuit.
20 k
Ω
1
2
V
IN
= 1.75 V
PP
100 nF
PULSE GEN.
V
PULSE
= 5 V,
f
PULSE
≤
1 kHz
St atus
Tx -en
Tx -in
R
ref
Tx -out
V
CC
GND
GND
8
7
6
5
V
OUT
5V
3
10 k
Ω
R
ref
24 k
Ω
4
100 µF
100 nF
HCPL-8100/0810
Figure 15. Tx enable/disable time test circuit.
20 k
Ω
1 µF
1
5V
V
IN
= 1.75 V
PP
100 nF
10 k
Ω
R
ref
24 k
Ω
2
3
4
Status
T x-en
Tx -in
R
ref
Tx -out
V
CC
GND
GND
8
7
6
5
100 µF
100 nF
5V
50
Ω
SPECTRUM
ANALYZER
HCPL - 8100/0810
Figure 16. Tx-out harmonic distortion test circuit.
8
HP [ AGILENT(HEWLETT-PACKARD) ]
