Typical Characteristics, T
A
= 25
°
C, V
CC
= 5 V
Parameter
Input Capacitance
Input Diode Temperature
Coefficient
Resistance (Input-Output)
Capacitance (Input-Output)
Transistor DC Current Gain
Small Signal Current
Transfer Ratio
Common Mode Transient
Immunity at Logic High
Level Output
Common Mode Transient
Immunity at Logic Low
Level Output
Bandwidth
Multi-Channel Product Only
Input-Input Insulation
Leakage Current
Resistance (Input-Input)
Capacitance (Input-Input)
Symbol
C
IN
∆V
F
∆T
A
R
I-O
C
I-O
h
FE
∆I
O
∆I
F
|CM
H
|
Typ.
60
-1.5
10
12
1.0
250
21
1000
Units
pF
mV/°C
Ω
pF
-
%
V/µs
Test Conditions
V
F
= 0 V, f = 1 MHz
I
F
= 20 mA
V
I-O
500 V
f = 1 MHz
V
O
= 5 V, I
O
= 3 mA
V
CC
= 5 V, V
O
= 2 V
I
F
= 0 mA, R
L
= 8.2 kΩ,
V
O
(min) = 2.0 V
V
CM
= 10 V
P-P
I
F
= 16 mA, R
L
= 8.2 kΩ,
V
O
(max) = 0.8 V
V
CM
= 10 V
P-P
Fig.
Note
1
1
3
1, 11
1
1
1, 7
7
10
|CM
L
|
-1000
V/µs
10
1, 7
BW
9
MHz
8
8
I
I-I
R
I-I
C
I-I
1
10
12
0.8
pA
Ω
pF
Relative Humidity = 45%
V
I-I
= 500 V, t = 5 s
V
I-I
= 500 V
f = 1 MHz
5, 9
5
5
Notes:
1. Each channel of a multi-channel device.
2. Current Transfer Ratio is defined as the ratio of output collector current, I
O
, to the forward LED input current, I
F
, times 100%.
CTR is known to degrade slightly over the unit’s lifetime as a function of input current, temperature, signal duty cycle, and system
on time. Refer to Application Note 1002 for more detail. ln short, it is recommended that designers allow at least 20-25%
guardband for CTR degradation.
3. All devices are considered two-terminal devices; measured between all input leads or terminals shorted together and all output
leads or terminals shorted together.
4. The 4N55, 4N55/883B, HCPL-6530 and HCPL-6531 dual channel parts function as two independent single channel units. Use the
single channel parameter limits. I
F
= 0 mA for channel under test and I
F
= 20 mA for other channels.
5. Measured between adjacent input pairs shorted together for each multichannel device.
6. t
PHL
propagation delay is measured from the 50% point on the leading edge of the input pulse to the 1.5 V point on the leading
edge of the output pulse. The t
PLH
propagation delay is measured from the 50% point on the trailing edge of the input pulse to the
1.5 V point on the trailing edge of the output pulse.
7. CM
L
is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic low state
(V
O
< 0.8 V). CM
H
is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the
logic high state (V
O
> 2.0 V).
8. Bandwidth is the frequency at which the ac output voltage is 3 dB below the low frequency asymptote. For the HCPL-5530 the
typical bandwidth is 2 MHz.
9. This is a momentary withstand test, not an operating condition.
10. Higher CTR minimums are available to support special applications.
11. Measured between each input pair shorted together and all output connections for that channel shorted together.
12. Standard parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD and 883B parts receive 100% testing at 25, 125, and
-55°C (Subgroups 1 and 9, 2 and 10, 3 and 11, respectively).
13. Not required for 4N55, 4N55/883B and 5962-8767901 types.
14. Required for 4N55, 4N55/883B and 5962-8767901 types only.
1-566
HP [ AGILENT(HEWLETT-PACKARD) ]
