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HCPL-4502-XXXE 参数 Datasheet PDF下载

HCPL-4502-XXXE图片预览
型号: HCPL-4502-XXXE
PDF下载: 下载PDF文件 查看货源
内容描述: 单通道,高速光电耦合器 [Single Channel, High Speed Optocouplers]
分类和应用: 光电
文件页数/大小: 16 页 / 149 K
品牌: HP [ HEWLETT-PACKARD ]
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11  
Package Characteristics  
Over recommended temperature (TA = 0°C to 70°C) unless otherwise specified.  
Parameter  
Sym.  
Device  
Min. Typ.* Max. Units Test Conditions Fig. Note  
Input-Output  
Momentary  
Withstand  
Voltage**  
V
ISO  
8-Pin DIP  
SO-8  
Widebody  
3750  
5000  
5000  
V rms RH < 50%,  
t = 1 min.,  
6, 14  
T = 25°C  
A
6, 15  
8-Pin DIP  
(Option 020)  
6, 12,  
15  
II-O  
8-Pin DIP  
1
µA  
45% RH, t = 5 s,  
I-O = 3 kVdc,  
6, 16  
V
T = 25°C  
VI-O = 500 Vdc  
A
Input-Output  
Resistance  
RI-O  
8-Pin DIP  
SO-8  
Widebody  
1012  
6
1012 1013  
1011  
T = 25°C  
T = 100°C  
A
A
Input-Output  
Capacitance  
CI-O  
8-Pin DIP  
SO-8  
0.6  
pF  
f = 1 MHz  
6
Widebody  
0.5  
0.6  
*All typicals at TA = 25°C.  
**The Input-Output Momentary Withstand Voltage is a dielectric voltage rating that should not be interpreted as an input-output  
continuous voltage rating. For the continuous voltage rating refer to the IEC/EN/DIN EN 60747-5-2 Insulation Related Characteristics  
Table (if applicable), your equipment level safety specification or Agilent Application Note 1074 entitled “Optocoupler Input-Output  
Endurance Voltage,” publication number 5963-2203E.  
Notes:  
1. Derate linearly above 70°C free-air temperature at a rate of 0.8 mA/°C (8-Pin DIP).  
Derate linearly above 85°C free-air temperature at a rate of 0.5 mA/°C (SO-8).  
2. Derate linearly above 70°C free-air temperature at a rate of 1.6 mA/°C (8-Pin DIP).  
Derate linearly above 85°C free-air temperature at a rate of 1.0 mA/°C (SO-8).  
3. Derate linearly above 70°C free-air temperature at a rate of 0.9 mW/°C (8-Pin DIP).  
Derate linearly above 85°C free-air temperature at a rate of 1.1 mW/°C (SO-8).  
4. Derate linearly above 70°C free-air temperature at a rate of 2.0 mW/°C (8-Pin DIP).  
Derate linearly above 85°C free-air temperature at a rate of 2.3 mW/°C (SO-8).  
5. CURRENT TRANSFER RATIO in percent is defined as the ratio of output collector current, IO, to the forward LED input current, IF,  
times 100.  
6. Device considered a two-terminal device: Pins 1, 2, 3, and 4 shorted together and Pins 5, 6, 7, and 8 shorted together.  
7. Common mode transient immunity in a Logic High level is the maximum tolerable (positive) dVCM/dt on the leading edge of the  
common mode pulse signal, VCM, to assure that the output will remain in a Logic High state (i.e., VO > 2.0 V). Common mode  
transient immunity in a Logic Low level is the maximum tolerable (negative) dVCM/dt on the trailing edge of the common mode pulse  
signal, VCM, to assure that the output will remain in a Logic Low state (i.e., VO < 0.8 V).  
8. The 1.9 kload represents 1 TTL unit load of 1.6 mA and the 5.6 kpull-up resistor.  
9. The 4.1 kload represents 1 LSTTL unit load of 0.36 mA and 6.1 kpull-up resistor.  
10. The frequency at which the ac output voltage is 3 dB below its mid-frequency value.  
11. The JEDEC registration for the 6N136 specifies a minimum CTR of 15%. Agilent guarantees a minimum CTR of 19%.  
12. See Option 020 data sheet for more information.  
13. Use of a 0.1 µf bypass capacitor connected between pins 5 and 8 is recommended.  
14. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage 4500 V rms for 1 second  
(leakage detection current limit, II-O 5 µA). This test is performed before the 100% Production test shown in the IEC/EN/DIN EN  
60747-5-2 Insulation Related Characteristics Table if applicable.  
15. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage 6000 V rms for 1 second  
(leakage detection current limit, II-O 5 µA). This test is performed before the 100% Production test shown in the IEC/EN/DIN EN  
60747-5-2 Insulation Related Characteristics Table if applicable.  
16. This rating is equally validated by an equivalent ac proof test.