I
F
I
PULSE
GEN.
F
8
7
6
5
1
2
3
4
+5 V
0
Z
t
= 50 Ω
= 5 ns
O
r
R
*
L
5 V
V
V
O
10% DUTY CYCLE
1/f < 100 µS
V
O
1.5 V
1.5 V
0.1µF
I
MONITOR
F
OL
C
= 1.5 µF
L
R
M
t
t
PHL
PLH
* PIN 7 UNCONNECTED IN HCPL-4502/3,
HCPL-0452/3, HCNW4502/3
Figure 11. Switching Test Circuit.
I
F
1
8
7
6
5
+5 V
B
R
2
L
*
V
CM
A
90% 90%
10%
r
10%
0 V
3
V
O
t
t
f
0.1 µF
V
O
4
5 V
V
V
FF
SWITCH AT A:
SWITCH AT B:
I
I
= 0 mA
F
F
V
O
OL
V
CM
= 16 mA
–
+
PULSE GEN.
*PIN 7 UNCONNECTED IN HCPL-4502/3, HCPL-0542/3, HCNW4502/3
Figure 12. Test Circuit for Transient Immunity and Typical Waveforms.
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Data subject to change.
Copyright © 2004 Agilent Technologies, Inc.
Obsoletes 5989-0305EN
December 20, 2004
5989-2112EN
HP [ HEWLETT-PACKARD ]
