HI-8195, HI-8196, HI-8197
TEST CIRCUITS
IDS
V1
IS(OFF)
ID(OFF)
SA
SB
SA
SB
A
A
+
+
+
-
RON = V1/IDS
VS
-
VS
-
VD
Figure 1 - On Resistance
Figure 2 - Off Leakage
+5V +15V
0.1μF
0.1μF
V
IN (HI-8196)
IN (HI-8195)
50%
50%
50%
50%
VLOGIC V+
V
SA
IN
SB
VOUT
90%
300W
35pF
GND
V-
+
-
50%
VS
V
OUT
0.1μF
-15V
t ON
t OFF
Figure 3. Switching Times
+5V +15V
VLOGIC V+
0.1μF
0.1μF
5V
V
IN
50%
50%
0V
S1A
S1B
S2B
VS1
VS2
VOUT1
VOUT2
90%
S2A
IN
50%
V
OUT1
OUT2
300W
35pF
300W
35pF
0.1μF
GND
V-
90%
V
50%
-15V
t D
t D
Figure 4. Break-Before-Make Time Delay (HI-8197)
HOLT INTEGRATED CIRCUITS
4