HI-3182, HI-3183, HI-3184, HI-3185, HI-3186, HI-3187, HI-3188
SYMBOL
VREF
FUNCTION
POWER
INPUT
DESCRIPTION
Reference voltage used to determine the output voltage swing
STROBE
SYNC
DATA (A)
CA
A logic high tri-states the ARINC outputs. Not available in the 14-pin SOIC package (tied to GND internally).
INPUT
Synchronizes data inputs
Data input terminal A
Connection for DATA (A) slew-rate capacitor
ARINC output terminal A
-12V to -15V
INPUT
INPUT
AOUT
OUTPUT
POWER
POWER
POWER
OUTPUT
INPUT
-V
GND
0.0V
+V
+12V to +15V
BOUT
ARINC output terminal B
Connection for DATA (B) slew-rate capacitor
Data input terminal B
Synchronizes data inputs
+5V ±5%
CB
DATA (B)
CLOCK
V1
INPUT
INPUT
POWER
All Voltages referenced to GND, TA = Operating Temperature Range (unless otherwise specified)
PARAMETER
Differential Voltage
Supply Voltage
SYMBOL
CONDITIONS
OPERATING RANGE
MAXIMUM
UNIT
VDIF
Voltage between +V and -V terminals
40
V
+V
-V
V1
+10.8 to +16.5
-10.8 to -16.5
+5 ±10%
V
V
V
+7
Voltage Reference
VREF
For ARINC 429
For Applications other than ARINC
+5 ±5%
0 to 6
6
6
V
V
Input Voltage Range
VIN
> GND -0.3
< V1 +0.3
V
V
Output Short-Circuit Duration
Output Overvoltage Protection
Operating Temperature Range
See Note: 1
See Note: 2
TA
Hi-temp & Military
Industrial
-55 to +125
-40 to +85
°C
°C
Storage Temperature Range
TSTG
Ceramic & Plastic
-65 to +150
°C
Lead Temperature
Soldering, 10 seconds
+275
+175
°C
°C
Junction Temperature
TJ
Note 1. Heatsinking may be required for Output Short Circuit at +125°C and for 100KBPS at +125°C.
Note 2. The fuses used for Output Overvoltage Protection may be blown by the presence of a voltage at either output that is greater
than ±12.0V with respect to GND. (HI-3182, 3184 & 3187 only)
NOTE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These a re stress ratings
only. Functional operation of the device at these or any other conditions above those indicated in the operational se ctions of the specifications
is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
HOLT INTEGRATED CIRCUITS
3
HOLTIC [ HOLT INTEGRATED CIRCUITS ]
