HI-3182, HI-3183, HI-3184, HI-3185, HI-3186, HI-3188
PIN DESCRIPTIONS
SYMBOL
V
REF
STROBE
SYNC
DATA (A)
C
A
A
OUT
-V
GND
+V
B
OUT
C
B
DATA (B)
CLOCK
V
1
FUNCTION
ANALOG
INPUT
INPUT
INPUT
INPUT
OUTPUT
POWER
POWER
POWER
OUTPUT
INPUT
INPUT
INPUT
POWER
DESCRIPTION
Ref. voltage used to determine output voltage swing. Pin sources current to allow use of a zener reference.
A logic high tri-states the ARINC outputs. Not available in the 14-pin SOIC package (tied to GND internally).
Synchronizes data inputs
Data input terminal A
Connection for DATA (A) slew-rate capacitor
ARINC output terminal A
-12V to -15V
0.0V
+12V to +15V
ARINC output terminal B
Connection for DATA (B) slew-rate capacitor
Data input terminal B
Synchronizes data inputs
+5V ±5%
ABSOLUTE MAXIMUM RATINGS
All Voltages referenced to GND, TA = Operating Temperature Range (unless otherwise specified)
PARAMETER
Differential Voltage
Supply Voltage
SYMBOL
V
DIF
+V
-V
V
1
V
REF
V
IN
CONDITIONS
Voltage between +V and -V terminals
OPERATING RANGE
MAXIMUM
40
UNIT
V
V
V
V
V
V
V
V
+10.8 to +16.5
-10.8 to -16.5
+5 ±5%
For ARINC 429
For Applications other than ARINC
+5 ±5%
1.5 to 6
+7
6
6
> GND -0.3
< V1 +0.3
Voltage Reference
Input Voltage Range
Output Short-Circuit Duration
Output Overvoltage Protection
Operating Temperature Range
Storage Temperature Range
Lead Temperature
Junction Temperature
See Note: 1
See Note: 2
T
A
T
STG
Industrial
Extended
Ceramic & Plastic
Soldering, 10 seconds
T
J
-40 to +85
-55 to +125
-65 to +150
+275
+175
°C
°C
°C
°C
°C
Note 1. Heatsinking may be required for continuous Output Short Circuit at +125°C and for 100KBPS at +125°C.
Note 2. The fuses used for Output Overvoltage Protection may be blown by the presence of a voltage at either output that is greater
than ±12.0V with respect to GND. (HI-3182 & 3184 only)
NOTE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings
only. Functional operation of the device at these or any other conditions above those indicated in the operational sections of the specifications
is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
HOLT INTEGRATED CIRCUITS
3
HOLTIC [ HOLT INTEGRATED CIRCUITS ]
