HT46R01B-1/HT46R01N-1
HT48R01B-1/HT48R01N-1
Ta=25°C
Test Conditions
Conditions
Symbol
Parameter
I/O Port Sink Current
I/O Port Source Current
PA7 Sink Current
Min.
Typ.
Max.
Unit
VDD
3V
5V
3V
5V
3V
5V
3V
5V
4
8
mA
mA
mA
mA
mA
mA
kW
kW
.
¾
¾
IOL1
V
V
V
OL=0.1VDD
OH=0.9VDD
OL=0.1VDD
10
-2
-5
0.8
2.0
20
10
20
-4
¾
IOH
-10
1.2
3.0
60
¾
¾
IOL2
¾
100
50
¾
¾
RPH
Pull-high Resistance
30
Note: The standby current (ISTB1~ISTB3) and IDD4 are measured with all I/O pins in input mode and tied to VDD
A.C. Characteristics
Ta=25°C
Test Conditions
Conditions
2.2V~5.5V
Symbol
Parameter
Min.
Typ.
Max.
Unit
VDD
32
4000
8000
kHz
kHz
¾
¾
¾
4
fSYS
System Clock
3.3V~5.5V
32
¾
4.5V~5.5V
32
12000 kHz
3V/5V
3V/5V
5V
+2%
+2%
+2%
+5%
+5%
+5%
MHz
MHz
MHz
MHz
MHz
MHz
Ta=25°C
-2%
-2%
-2%
-5%
-5%
-5%
8
Ta=25°C
12
4
Ta=25°C
3V/5V
3V/5V
5V
Ta=0~70°C
Ta=0~70°C
Ta=0~70°C
8
12
2.2V~
3.6V
4
4
+8%
+8%
+8%
+8%
MHz
MHz
MHz
MHz
Ta=0~70°C
-8%
-8%
3.0V~
5.5V
Ta=0~70°C
System Clock
(HIRC)
fHIRC
3.0V~
5.5V
8
Ta=0~70°C
-8%
4.5V~
5.5V
12
4
Ta=0~70°C
-8%
2.2V~
3.6V
+12% MHz
+12% MHz
+12% MHz
+12% MHz
Ta= -40°C~85°C
Ta= -40°C~85°C
Ta= -40°C~85°C
Ta= -40°C~85°C
-12%
-12%
-12%
-12%
3.0V~
5.5V
4
3.0V~
5.5V
8
4.5V~
5.5V
12
Rev.1.00
8
June 9, 2011
HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
