HT46RU66/HT46CU66
Test Conditions
Symbol
Parameter
Min.
Typ.
Max.
Unit
VDD
3V
5V
3V
5V
Conditions
20
10
¾
¾
60
30
100
50
1
¾
¾
kW
kW
Pull-high Resistance of I/O Ports
and INT0, INT1
RPH
0.5
1.5
mA
mA
Additional Power Consumption
if A/D Converter is Used
IADC
tAD=1ms
3
AVDD=5V, VREF=AVDD
AD=1ms
AVDD=5V, VREF=AVDD
AD=1ms
,
,
DNL
INL
ADC Differential Non-Linear
ADC Integral Non-Linear
5V
LSB
¾
¾
±2
t
5V
LSB
Bits
¾
¾
±2.5
±4
t
RESOLU Resolution
12
¾
¾
¾
Note:
1. ²*fS² refer to the WDT clock option
2. ISTB1=WDT disable, ISTB2~ISTB7=WDT enable
3. Voltage level of AVDD and VDD must be the same.
A.C. Characteristics
Ta=25°C
Test Conditions
Conditions
2.2V~5.5V
Symbol
Parameter
Min.
Typ.
Max.
Unit
VDD
¾
400
400
4000
8000
kHz
kHz
¾
¾
System Clock
fSYS1
(Crystal OSC, RC OSC)
3.3V~5.5V
¾
System Clock
fSYS2
2.2V~5.5V
32768
Hz
¾
¾
¾
(32768Hz Crystal OSC)
fRTCOSC
RTC Frequency
32768
¾
Hz
kHz
kHz
ms
¾
¾
¾
3V
5V
¾
¾
¾
0
¾
4000
8000
180
130
¾
2.2V~5.5V
Timer I/P Frequency
(TMR0/TMR1)
fTIMER
3.3V~5.5V
0
¾
45
32
1
90
¾
¾
¾
tWDTOSC
Watchdog Oscillator Period
65
ms
tRES
tSST
External Reset Low Pulse Width
System Start-up Timer Period
¾
ms
Power-up or wake-up
from HALT
tSYS
1024
¾
¾
¾
tINT
Interrupt Pulse Width
A/D Clock Period
1
1
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
80
32
¾
¾
¾
¾
ms
ms
tAD
tADC
tADCS
tAD
tAD
A/D Conversion Time
A/D Sampling Time
¾
¾
Note: tSYS= 1/fSYS1 or 1/fSYS2
Rev. 1.30
7
May 25, 2011
HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
