HT45R37
Test Conditions
Symbol
Parameter
V
DD
I
OH1
3V
I/O Port Source Current
5V
I
OL2
3V
PC0 Sink Current
5V
R
PH
V
AD
V
REF
DNL
INL
Pull-high Resistance for I/O
Ports
A/D Input Voltage
A/D Input Reference Voltage
Range
A/C Differential Non-Linearity
ADC Integral Non-Linearity
Additional Power Consumption
if A/D Converter is Used
3V
5V
¾
¾
¾
¾
3V
5V
¾
¾
¾
AV
DD
=5V, V
REF
=A
VDD
,
t
AD
=0.5ms
AV
DD
=5V, V
REF
=A
VDD
,
t
AD
=0.5ms
¾
V
OL
=0.1V
DD
Conditions
V
OH
=0.9V
DD
-2
-5
0.8
2
20
10
0
¾
-2
-4
¾
¾
-4
-8
1.5
4
60
30
¾
AV
DD
¾
¾
0.5
1.5
¾
¾
¾
¾
100
50
AV
DD
¾
2
4
1
3
mA
mA
mA
mA
kW
kW
V
V
LSB
LSB
mA
mA
Min.
Typ.
Max.
Unit
I
ADC
Note:
1. 32768Hz is in slow start mode (RTCC.4=1) for the D.C. current measurement.
2. f
S
is the internal clock for Buzzer, RTC, Time base and WDT.
3. Both Timer/Event Counters are off. Timer filter is disabled for all test conditions.
4. All peripherals are in OFF condition if not mentioned at I
DD
, I
STB
tests.
Rev. 1.20
6
February 25, 2011
HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
