HT36B2
Absolute Maximum Ratings
Supply Voltage .............................V
SS
-0.3V
to V
SS
+6V
Input Voltage .............................V
SS
-0
.
3V to V
DD
+0.3V
Storage Temperature ...........................-50°C to 125°C
Operating Temperature ..........................-25°C to 70°C
Note: These are stress ratings only. Stresses exceeding the range specified under
²Absolute
Maximum Ratings² may
cause substantial damage to the device. Functional operation of this device at other conditions beyond those
listed in the specification is not implied and prolonged exposure to extreme conditions may affect device reliabil-
ity.
D.C. Characteristics
Symbol
V
DD
I
DD
I
STB
I
OH
I
OL
V
IH
V
IL
R
PH
Parameter
Operating Voltage
Operating Current
Standby Current (WDT Disabled)
I/O Ports Source Current
I/O Ports Sink Current
Input High Voltage for I/O Ports
Input Low Voltage for I/O Ports
Pull-High Resistance of I/O Ports (INT)
Test Conditions
V
DD
¾
4.5V
4.5V
4.5V
4.5V
4.5V
4.5V
4.5V
V
IL
=0V
Conditions
¾
No load,
f
OSC
=11.0592MHz
No load,
System HALT
V
OH
=4.5V
V
OL
=0.5V
¾
¾
Min.
3.6
¾
¾
5
5
0.8V
DD
0
¾
Typ.
4.5
16
1
¾
¾
¾
¾
30
Max.
5.5
32
3
¾
¾
V
DD
0.2V
DD
¾
Ta=25°C
Unit
V
mA
mA
mA
mA
V
V
kW
A.C. Characteristics
Symbol
MCU Interface
f
OSC
f
SYS
t
WDT
t
RES
System Frequency
System Clock
Watchdog Time-Out Period (RC)
External Reset Low Pulse Width
5V
5V
¾
¾
11.059MHz crystal
¾
Without WDT prescaler
¾
¾
8
9
1
11.059
¾
17
¾
¾
12
35
¾
Parameter
Test Conditions
V
DD
Conditions
Min.
Typ.
Max.
Ta=25°C
Unit
MHz
MHz
ms
ms
Symbol
DAC Interface
f
BC
t
CH
t
DOS
t
DOH
t
LCS
t
LCH
Parameter
Figure
Min.
Typ.
Max.
Unit
DCK Bit Clock Frequency
DCK Bit Clock H Level Time
Data Output Setup Time
Data Output Hold Time
Load Clock Setup Time
Load Clock Hold Time
Fig 1
Fig 1
Fig 1
Fig 1
Fig 1
Fig 1
¾
600
200
200
200
200
f
SYS
/16
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
MHz
ns
ns
ns
ns
ns
Rev. 1.10
5
March 10, 2005
HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
