HT27LC010
D.C. Characteristics
Symbol
Read Operation
V
OH
V
OL
V
IH
V
IL
I
LI
I
LO
I
CC
I
SB1
I
SB2
I
PP
Output High Level
Output Low Level
Input High Level
Input Low Level
Input Leakage Current
Output Leakage Current
VCC Active Current
Standby Current (CMOS)
Standby Current (TTL)
VPP Read/Standby Current
3.3V
3.3V
3.3V
3.3V
3.3V
3.3V
3.3V
3.3V
3.3V
3.3V
I
OH
=-0.4mA
I
OL
=2.0mA
¾
¾
V
IN
=0 to 3.6V
V
OUT
=0 to 3.6V
CE=V
IL
, f=5MHz,
I
OUT
=0mA
CE=V
CC
±0.3V
CE=V
IH
CE=OE=V
IL
, V
PP
=V
CC
2.4
¾
2.0
-0.3
-5
-10
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
1.0
¾
¾
¾
0.45
V
CC
+0.5
0.8
5
10
15
10
0.6
100
V
V
V
V
mA
mA
mA
mA
mA
mA
Parameter
Test Conditions
V
CC
Conditions
Min.
Typ.
Max.
Unit
Programming Operation
V
OH
V
OL
V
IH
V
IL
I
LI
V
H
I
CC
I
PP
Output High Level
Output Low Level
Input High Level
Input Low Level
Input Load Current
A9 Product ID Voltage
VCC Supply Current
VPP Supply Current
6V
6V
6V
6V
6V
6V
6V
6V
CE=V
IL
I
OH
=-0.4mA
I
OL
=2.0mA
¾
¾
V
IN
=V
IL
, V
IH
¾
¾
2.4
¾
0.7V
CC
-0.5
¾
11.5
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
0.45
V
CC
+0.5
0.8
5.0
12.5
40
10
V
V
V
V
mA
V
mA
mA
Capacitance
C
IN
C
OUT
C
VPP
Input Capacitance
Output Capacitance
VPP Capacitance
3.3V
3.3V
3.3V
V
IN
=0V
V
OUT
=0V
V
PP
=0V
¾
¾
¾
8
8
18
12
12
25
pF
pF
pF
A.C. Characteristics
Symbol
Read Operation
t
ACC
t
CE
t
OE
t
DF
t
OH
Address to Output Delay
Chip Enable to Output Delay
Output Enable to Output Delay
3.3V CE=OE=V
IL
3.3V OE=V
IL
3.3V CE=V
IL
¾
¾
¾
¾
¾
¾
0
¾
¾
¾
¾
¾
Parameter
Test Conditions
V
CC
Conditions
Min.
Typ.
Ta=+25°C±5°C
Max.
Unit
90
90
45
40
¾
ns
ns
ns
ns
ns
CE or OE High to Output Float, Whichever
3.3V
Occurred First
Output Hold from Address, CE or OE,
Whichever Occurred First
3.3V
Rev. 1.30
3
December 8, 2003
HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
