Preliminary
HT27C040
Ta=+25°C±5°C
Programming operation
Test Conditions
Symbol
Parameter
Min. Typ. Max. Unit
VCC
6V
6V
6V
6V
6V
Conditions
tAS
Address Setup Time
OE Setup Time
2
2
2
0
2
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
ms
ms
ms
ms
ms
tOES
tDS
tAH
tDH
Data Setup Time
Address Hold Time
Data Hold Time
Output Enable to Output Float
Delay
tDFP
6V
0
130
ns
¾
¾
tVPS
tPW
VPP Setup Time
6V
6V
6V
6V
6V
2
30
2
¾
¾
¾
¾
¾
¾
75
¾
¾
¾
¾
105
¾
ms
ms
ms
ns
ms
PGM Program Pulse Width
VCC Setup Time
tVCS
tCES
tOE
CE Setup Time
2
¾
Data Valid from OE
150
¾
VPP Pulse Rise Time During
Programming
tPRT
6V
2
¾
¾
¾
ms
Test waveforms and measurements
For -70, -90, -120 devices
2
.
4
V
2
.
0
V
C
A
M
L
A
C
D
r
i
v
i
n
g
e
a
s
u
r
e
m
e
n
t
L
e
v
e
l
s
e
v
e
l
0
.
8
V
0
.
4
5
V
tR, tF< 20ns (10% to 90%)
Output test load
1
.
3
V
(
1
N
9
1
4
)
3
.
W
3
k
Note: CL=100pF including jig capacitance, except for the
n
O
u
t
p
u
t
P
i
-45 devices, where CL=30pF.
C
L
5
August 29, 2000
HOLTEK [ HOLTEK SEMICONDUCTOR INC ]
