HANBit
HMF4M32M8G
ERASE AND PROGRAMMING PERFORMANCE
LIMITS
PARAMETER
UNIT
sec
ms
COMMENTS
MIN.
TYP.
MAX.
Excludes 00H programming
prior to erasure
Sector Erase Time
-
1
8
Excludes system-level
overhead
Byte Programming Time
Chip Programming Time
-
-
7
300
Excludes system-level
overhead
14.4
43.2
sec
TSOP CAPACITANCE
PARAMETER
SYMBOL
CIN
PARAMETER
DESCRIPTION
TEST SETUP
MIN
MAX
UNIT
Input Capacitance
VIN = 0
VOUT = 0
VIN = 0
6
7.5
12
9
pF
pF
pF
COUT
Output Capacitance
8.5
7.5
CIN2
Control Pin Capacitance
: Test conditions TA = 25o C, f=1.0 MHz.
Notes
AC CHARACTERISTICS
Read Only Operations Characteristics
u
PARAMETER
SYMBOLS
JEDEC STANDARD
DESCRIPTION
TEST SETUP
-75
-90
UNIT
tAVAV
tAVQV
tRC
Read Cycle Time
Min
70
70
90
90
ns
ns
tACC
/CE = VIL
/OE = VIL
/OE = VIL
Address to Output Delay
Max
tELQV
tGLQV
tEHQZ
tGHQZ
tCE
tOE
tDF
tDF
Chip Enable to Output Delay
Chip Enable to Output Delay
Chip Enable to Output High-Z
Output Enable to Output High-Z
Max
Max
Max
Max
70
40
20
20
90
40
20
20
ns
ns
ns
ns
Output Hold Time From Addresses,
/CE or /OE, Whichever Occurs First
tAXQX
tQH
Min
0
0
ns
TEST SPECIFICATIONS
TEST CONDITION
ALL SPEED OPTIONS
UNIT
Output load
1TTL gate
4
URL: www.hbe.co.kr
REV.02(August,2002)
HANBit Electronics Co., Ltd.
HANBIT [ HANBIT ELECTRONICS CO.,LTD ]
