GS8662QT07/10/19/37BD-357/333/300/250/200
Capacitance
o
(T = 25 C, f = 1 MHZ, V = 1.8 V)
A
DD
Parameter
Symbol
CIN
Test conditions
VIN = 0 V
Typ.
Max.
Unit
pF
Input Capacitance
Output Capacitance
Clock Capacitance
4
6
5
5
7
6
COUT
CCLK
VOUT = 0 V
VIN = 0 V
pF
pF
Note:
This parameter is sample tested.
AC Test Conditions
Parameter
Input high level
Input low level
Conditions
1.25
0.25 V
2 V/ns
Max. input slew rate
Input reference level
Output reference level
0.75
VDDQ/2
Note:
Test conditions as specified with output loading as shown unless otherwise noted.
AC Test Load Diagram
DQ
RQ = 250 (HSTL I/O)
= 0.75 V
V
REF
50
VT == 0.75 V
Input and Output Leakage Characteristics
Parameter
Symbol
Test Conditions
Min.
Max
Input Leakage Current
(except mode pins)
IIL
VIN = 0 to VDD
–2 uA
–2 uA
2 uA
IILDOFF
IIL ODT
VIN = 0 to VDD
VIN = 0 to VDD
Doff
100 uA
2 uA
ODT
–100 uA
–2 uA
Output Disable,
VOUT = 0 to VDDQ
IOL
Output Leakage Current
2 uA
Rev: 1.00b 8/2017
13/28
© 2011, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GSI [ GSI TECHNOLOGY ]
