AC ELECTRICAL CHARACTERISTICS
VCC = 5.0V, VEE = 0V, TA = 25°C unless otherwise stated, RLF = 1.8K, CLF1 = 15nF, CLF2 = 3.3pF
TEST
LEVEL
1
PARAMETER
CONDITION
MIN
MAX
UNITS
NOTES
TYPICAL
Serial Data Rate
Intrinsic Jitter
SDI
143
-
540
Mb/s
1
4
270Mb/s
540Mb/s
270Mb/s
360Mb/s
540Mb/s
270Mb/s
540Mb/s
-
185
164
462
308
260
0.56
0.43
1
See Figure 6
ps p-p
2
2
23
Psuedorandom (2 - 1)
-
Intrinsic Jitter
-
See Figure 7
ps p-p
UI p-p
1
Pathological
(SDI checkfield)
-
-
Input Jitter Tolerance
0.40
-
-
-
-
-
-
3
4
1
7
0.35
Lock Time Synchronous tSWITCH < 0.5µs, 270Mb/s
Switch
-
-
-
-
µs
ms
ms
ms
0.5µs < tSWITCH < 10ms
1
tSWITCH > 10ms
4
Lock Time
Asynchronous Switch
Loop Bandwidth = 6MHz at 540 Mb/s
10
5
6
7
Carrier Loss Time
RLOCK = 10k, CLOAD =5pF
0.5
1
0
2
µs
ps
7
7
SDO to SCO
-200
200
Synchronization
SDO, SCO Output Signal 75Ω DC load
Swing
600
200
800
300
1000
400
mV p-p
ps
1
7
SDO, SCO Rise and Fall 20% - 80%
Times
NOTES
1. TYPICAL - measured on EB-RD35A board, TA = 25°C.
2. Characterized 6 sigma rms.
3. IJT measured with sinusoidal modulation beyond Loop Bandwidth (at 6.5MHz).
4. Synchronous switching refers to switching the input data from one source to another source which is at the same data rate (ie: line 10
switching for component NTSC).
5. Asynchronous switching refers to switching the input data from one source to another source which is at a different data rate.
6. Carrier Loss Time refers to the response of the SDO output from valid re-clocked input data to mute mode when the input signal is
removed.
TEST LEVEL
1. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges.
2. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges using correlated
test.
3. Production test at room temperature and nominal supply voltage.
4. QA sample test.
5. Calculated result based on Level 1,2, or 3.
6. Not tested. Guaranteed by design simulations.
7. Not tested. Based on characterization of nominal parts.
8. Not tested. Based on existing design/characterization data of similar product.
3
522 - 41 - 01
GENNUM [ GENNUM CORPORATION ]
