AC ELECTRICAL CHARACTERISTICS
V
CC
= 5V, V
EE
= 0V, T
A
= 0° – 70°C unless otherwise specified.
PARAMETER
Serial Data Bit Rate
SYMBOL
BR
SDO
V
SDO
V
SDOMIN
V
SDOMAX
t
r
, t
f
CONDITIONS
R
VCO
= 374Ω
R
LOAD
= 37.5Ω, R
SET
= 54.9Ω
R
LOAD
= 37.5Ω, R
SET
= 73.2Ω
R
LOAD
= 37.5Ω, R
SET
= 43.2Ω
20% - 80%
MIN
143
TYP
-
MAX
540
UNITS
Mb/s
NOTES
SMPTE
259M
TEST
LEVEL
3
Serial Data Outputs Signal
Swing
Min. Swing (adjusted)
Max. Swing (adjusted)
SD Rise/Fall Times
SD Overshoot/Undershoot
Output Return Loss
Lock Time
Min. Loop Bandwidth
740
800
860
mVp-p
1
GS90032
-
-
400
-
600
1000
-
-
-
-
220
-
-
700
7
-
5
-
mVp-p
mVp-p
ps
%
dB
ms
kHz
1
1
7
1
7
7
7
6
7
O
RL
t
LOCK
BW
MIN
at 540MHz
Worst case
270Mb/s
LBWC = Grounded : BW
MIN
15
-
-
Typical Loop Bandwidth
BW
TYP
270Mb/s
LBWC = Floating :
-
500
-
kHz
7
10
BW
MIN
-
1.7
-
MHz
7
Max. Loop Bandwidth
BW
MAX
270Mb/s
LBWC = V
CC
: 10 BW
MIN
Intrinsic Jitter (6σ)
143Mb/s
177Mb/s
270Mb/s
360Mb/s
540Mb/s
LBWC = floating
LBWC = V
CC
-
-
-
-
-
0.07
0.07
0.08
0.09
0.11
-
-
-
-
-
-
-
-
-
NOTES
UI
3
Data & Clock Inputs
(PD[9:0] PCLKIN)
TEST LEVELS
t
SU
t
H
Setup Time at 25°C
Hold Time at 25°C
2.5
2.0
ns
ns
3
3
1. Production test at room temperature and nominal supply voltage with guardbands for
supply and temperature ranges.
2. Production test at room temperature and nominal supply voltage with guardbands for
supply and temperature ranges using correlated test.
3. Production test at room temperature and nominal supply voltage.
4. QA sample test.
5. Calculated result based on Level 1,2, or 3.
6. Not tested. Guaranteed by design simulations.
7. Not tested. Based on characterization of nominal parts.
8. Not tested. Based on existing design/characterization data of similar product.
1. Depends on PCB layout.
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GENNUM [ GENNUM CORPORATION ]
